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説明
Parametric Tester構成
構成なしOEMモデルの説明
The Agilent 4072B Advanced Parametric Tester is designed to perform fast and precise DC measurements, capacitance measurements, flash memory cell tests, and other high-frequency applications. The system supports up to eight Source Monitor Units (SMUs). Each SMU is self-calibrating, and can be individually configured to force either current or voltage, as well as simultaneously measure either current or voltage.ドキュメント
ドキュメントなし
カテゴリ
Final Test
最終検証： 30日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
119598
ウェーハサイズ：
8"/200mm
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP)
4072B
カテゴリ
Final Test
最終検証： 30日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
119598
ウェーハサイズ：
8"/200mm
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Parametric Tester構成
構成なしOEMモデルの説明
The Agilent 4072B Advanced Parametric Tester is designed to perform fast and precise DC measurements, capacitance measurements, flash memory cell tests, and other high-frequency applications. The system supports up to eight Source Monitor Units (SMUs). Each SMU is self-calibrating, and can be individually configured to force either current or voltage, as well as simultaneously measure either current or voltage.ドキュメント
ドキュメントなし