説明
説明なし構成
Part Number: 97152822 • Revision: REV 3 • Description: High-density pogo pin interface board featuring multiple vertical daughter cards (blades). • Architecture: Modular slot-based design. The assembly contains approximately 20 signal/power cards designed for high-parallelism testing. • Applications: Mixed-signal testing, power management ICs (PMIC), and consumer microcontrollers.OEMモデルの説明
Sapphire is our next generation high performance SoC configurable test platform. First shipped by NPTest in December 2003, it is designed to be a highly reconfigurable and scalable functional and structural tester for a wide range of ICs. All of Sapphire’s test electronics are integrated in the test head and interconnected by a proprietary high bandwidth bus, which results in a lower cost platform and a smaller footprint. Sapphire can be used for design debug and validation, characterization, wafer sort and final test. The design supports a broad configuration range of up to 5,000 pins and a performance envelope that ranges from 200 MHz to 6.4 GHz.ドキュメント
ドキュメントなし
カテゴリ
Final Test
最終検証： 8日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
Deinstalled
製品ID：
144985
ウェーハサイズ：
不明
Config / Diag File:
No
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
COHU / LTX-CREDENCE
SAPPHIRE
カテゴリ
Final Test
最終検証： 8日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
Deinstalled
製品ID：
144985
ウェーハサイズ：
不明
Config / Diag File:
No
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
Part Number: 97152822 • Revision: REV 3 • Description: High-density pogo pin interface board featuring multiple vertical daughter cards (blades). • Architecture: Modular slot-based design. The assembly contains approximately 20 signal/power cards designed for high-parallelism testing. • Applications: Mixed-signal testing, power management ICs (PMIC), and consumer microcontrollers.OEMモデルの説明
Sapphire is our next generation high performance SoC configurable test platform. First shipped by NPTest in December 2003, it is designed to be a highly reconfigurable and scalable functional and structural tester for a wide range of ICs. All of Sapphire’s test electronics are integrated in the test head and interconnected by a proprietary high bandwidth bus, which results in a lower cost platform and a smaller footprint. Sapphire can be used for design debug and validation, characterization, wafer sort and final test. The design supports a broad configuration range of up to 5,000 pins and a performance envelope that ranges from 200 MHz to 6.4 GHz.ドキュメント
ドキュメントなし