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COHU / LTX-CREDENCE SAPPHIRE
    説明
    説明なし
    構成
    CREDENCE SAPPHIRE TESTER - Configuration: // Configuring Credence_TestHeadIf in slot[0] // Configuring NPTest_6AmpDPS in slot[1] // Configuring NPTest_6AmpDPS in slot[2] // Configuring NPTest_6AmpDPS in slot[37] // Configuring NPTest_D4064PS in slot[6] // Configuring NPTest_D4064PS in slot[7] // Configuring NPTest_D4064PS in slot[31] // Configuring NPTest_QBIX in slot[16] // Configuring NPTest_QBIX in slot[23] + calibration kit Credence SAPPHIRE Spare Instruments: 12 Cartes D4064 (64 channels digitaux 400MBs) P/N 9615-2147 1 Carte QBIX (Analog cards 4 channels) P/N 9615-2007 2 Cartes D3208 (8 channels digitaux 3.2 Gbs) P/N 9615-2158 4 Cartes DPS (Power Supply) P/N 9615-2005 1 Carte THIF (Test Head interface) P/N 9615-2014 18 Module 48V P/N 122_1257-00 6 Module 24V P/N 001-4062-0007
    OEMモデルの説明
    Sapphire is our next generation high performance SoC configurable test platform. First shipped by NPTest in December 2003, it is designed to be a highly reconfigurable and scalable functional and structural tester for a wide range of ICs. All of Sapphire’s test electronics are integrated in the test head and interconnected by a proprietary high bandwidth bus, which results in a lower cost platform and a smaller footprint. Sapphire can be used for design debug and validation, characterization, wafer sort and final test. The design supports a broad configuration range of up to 5,000 pins and a performance envelope that ranges from 200 MHz to 6.4 GHz.
    ドキュメント

    ドキュメントなし

    COHU / LTX-CREDENCE

    SAPPHIRE

    verified-listing-icon

    検証済み

    カテゴリ
    Final Test

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    73441


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    COHU / LTX-CREDENCE SAPPHIRE

    COHU / LTX-CREDENCE

    SAPPHIRE

    Final Test
    ヴィンテージ: 2007状態: 中古
    最終確認60日以上前

    COHU / LTX-CREDENCE

    SAPPHIRE

    verified-listing-icon
    検証済み
    カテゴリ
    Final Test
    最終検証: 60日以上前
    listing-photo-31db9ed847a447199f4a3909f3e7196c-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/51800/31db9ed847a447199f4a3909f3e7196c/39d2f74c94d440e0ad2cf4d82b4382a1_b866ce7888f24c9d9348a8a7e002779d1201a_mw.jpeg
    listing-photo-31db9ed847a447199f4a3909f3e7196c-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/51800/31db9ed847a447199f4a3909f3e7196c/48602d33b4e64d43bd9e8b91766014f5_34f16195ebf146e5aa2c14530bc249c81201a_mw.jpeg
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    73441


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    説明なし
    構成
    CREDENCE SAPPHIRE TESTER - Configuration: // Configuring Credence_TestHeadIf in slot[0] // Configuring NPTest_6AmpDPS in slot[1] // Configuring NPTest_6AmpDPS in slot[2] // Configuring NPTest_6AmpDPS in slot[37] // Configuring NPTest_D4064PS in slot[6] // Configuring NPTest_D4064PS in slot[7] // Configuring NPTest_D4064PS in slot[31] // Configuring NPTest_QBIX in slot[16] // Configuring NPTest_QBIX in slot[23] + calibration kit Credence SAPPHIRE Spare Instruments: 12 Cartes D4064 (64 channels digitaux 400MBs) P/N 9615-2147 1 Carte QBIX (Analog cards 4 channels) P/N 9615-2007 2 Cartes D3208 (8 channels digitaux 3.2 Gbs) P/N 9615-2158 4 Cartes DPS (Power Supply) P/N 9615-2005 1 Carte THIF (Test Head interface) P/N 9615-2014 18 Module 48V P/N 122_1257-00 6 Module 24V P/N 001-4062-0007
    OEMモデルの説明
    Sapphire is our next generation high performance SoC configurable test platform. First shipped by NPTest in December 2003, it is designed to be a highly reconfigurable and scalable functional and structural tester for a wide range of ICs. All of Sapphire’s test electronics are integrated in the test head and interconnected by a proprietary high bandwidth bus, which results in a lower cost platform and a smaller footprint. Sapphire can be used for design debug and validation, characterization, wafer sort and final test. The design supports a broad configuration range of up to 5,000 pins and a performance envelope that ranges from 200 MHz to 6.4 GHz.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    COHU / LTX-CREDENCE SAPPHIRE

    COHU / LTX-CREDENCE

    SAPPHIRE

    Final Testヴィンテージ: 2007状態: 中古最終検証:60日以上前
    COHU / LTX-CREDENCE SAPPHIRE

    COHU / LTX-CREDENCE

    SAPPHIRE

    Final Testヴィンテージ: 0状態: 中古最終検証:60日以上前
    COHU / LTX-CREDENCE SAPPHIRE

    COHU / LTX-CREDENCE

    SAPPHIRE

    Final Testヴィンテージ: 0状態: 中古最終検証:30日前