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ONTO / NANOMETRICS / ACCENT / BIO-RAD VerteX
    説明
    Wafer Characterization
    構成
    構成なし
    OEMモデルの説明
    Vertex is the latest addition to the RPM family and is designed to deliver industry-leading accuracy, repeatability, and tool-to-tool matching. It is a PL Mapping System with Power Density Control that brings the PL measurement process under control, ensuring that your epitaxial process stays firmly under control. Vertex provides accurate, precise, and repeatable PL metrology across the entire wavelength range, including high-Al content AlGaN alloys for GaN FET’s and UV lasers to the Antimonides out in the MIR and everything in between. It offers a catalog of more than 15 standard lasers and the ability to fiber-feed a virtually unlimited array of sources. The monochromator can be fitted with up to three gratings and two array detectors, and every optical component is selected under computer control. Vertex also contains its own built-in spectral source for monochromator calibration. The system can accommodate up to 4 internally mounted lasers, two of which feature a continuously-variable power control with feedback loop. Large lasers can be fiber-connected, and for film thickness measurements, the system can be fitted with a white light source. The Vertex software also includes a Fourier Transform facility for data interpretation.
    ドキュメント

    ドキュメントなし

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    VerteX

    verified-listing-icon

    検証済み

    カテゴリ
    Metrology

    最終検証: 15日前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    116289


    ウェーハサイズ:

    8"/200mm


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    ONTO / NANOMETRICS / ACCENT / BIO-RAD VerteX

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    VerteX

    Metrology
    ヴィンテージ: 2008状態: 中古
    最終確認60日以上前

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    VerteX

    verified-listing-icon
    検証済み
    カテゴリ
    Metrology
    最終検証: 15日前
    listing-photo-5a40198c535c44ccaa80f9e4ace876d9-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    116289


    ウェーハサイズ:

    8"/200mm


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    Wafer Characterization
    構成
    構成なし
    OEMモデルの説明
    Vertex is the latest addition to the RPM family and is designed to deliver industry-leading accuracy, repeatability, and tool-to-tool matching. It is a PL Mapping System with Power Density Control that brings the PL measurement process under control, ensuring that your epitaxial process stays firmly under control. Vertex provides accurate, precise, and repeatable PL metrology across the entire wavelength range, including high-Al content AlGaN alloys for GaN FET’s and UV lasers to the Antimonides out in the MIR and everything in between. It offers a catalog of more than 15 standard lasers and the ability to fiber-feed a virtually unlimited array of sources. The monochromator can be fitted with up to three gratings and two array detectors, and every optical component is selected under computer control. Vertex also contains its own built-in spectral source for monochromator calibration. The system can accommodate up to 4 internally mounted lasers, two of which feature a continuously-variable power control with feedback loop. Large lasers can be fiber-connected, and for film thickness measurements, the system can be fitted with a white light source. The Vertex software also includes a Fourier Transform facility for data interpretation.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    ONTO / NANOMETRICS / ACCENT / BIO-RAD VerteX

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    VerteX

    Metrologyヴィンテージ: 2008状態: 中古最終検証:60日以上前
    ONTO / NANOMETRICS / ACCENT / BIO-RAD VerteX

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    VerteX

    Metrologyヴィンテージ: 0状態: 中古最終検証:15日前
    ONTO / NANOMETRICS / ACCENT / BIO-RAD VerteX

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    VerteX

    Metrologyヴィンテージ: 0状態: 中古最終検証:15日前