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CAMECA IMS-4F
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The Cameca IMS 4F is the successor to the IMS 3F and contains all the features of its predecessor plus improvements of the basic instrument as well as new accessories. It is an ion microprobe that is based on the phenomenon of ion-induced sputtering of a solid sample by an energetic primary ion beam, typically consisting of oxygen or cesium ions at beam energy of 5 – 20 keV. It is a tool for investigating isotopic composition in the chemical, material, geological and biological sciences and can detect all elements (H to U) in depth profiling, surface, bulk and microanalysis modes.
    ドキュメント
    ファイルアイコン

    Cameca IMS 4F.pdf

    CAMECA

    IMS-4F

    verified-listing-icon

    検証済み

    カテゴリ
    Metrology

    最終検証： 60日以上前

    主なアイテムの詳細
    状態：

    Used

    稼働ステータス:

    不明

    製品ID：

    59344

    ウェーハサイズ：

    不明

    ヴィンテージ：

    不明

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    同様のリスト
    すべて表示
    CAMECA IMS-4F

    CAMECA

    IMS-4F

    Metrology
    ヴィンテージ： 0状態： 中古
    最終確認60日以上前

    CAMECA

    IMS-4F

    verified-listing-icon
    検証済み
    カテゴリ
    Metrology
    最終検証： 60日以上前
    listing-photo-8fab3bd64df64ed29049afed0b548278-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/49151/8fab3bd64df64ed29049afed0b548278/6027a6c6966e452c84838e38578e628e_labspettrometriamassaionisecondarifig1_mw.jpeg
    listing-photo-8fab3bd64df64ed29049afed0b548278-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/49151/8fab3bd64df64ed29049afed0b548278/7018c249ae3a4cb89a782aa35ba9ca62_labspettrometriamassaionisecondarifig2_mw.jpeg
    listing-photo-8fab3bd64df64ed29049afed0b548278-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/49151/8fab3bd64df64ed29049afed0b548278/5fc16fa72d9a45638a4b5862c3cbd5ca_labspettrometriamassaionisecondarifig3_mw.jpeg
    listing-photo-8fab3bd64df64ed29049afed0b548278-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/49151/8fab3bd64df64ed29049afed0b548278/f13014b6090a4b92ac6128cf5d69b72b_labspettrometriamassaionisecondarifig7_mw.jpeg
    listing-photo-8fab3bd64df64ed29049afed0b548278-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/49151/8fab3bd64df64ed29049afed0b548278/ab7df4728de24c968735e271aaf17ccd_1902f26f8f1844638b6c54599010528a1201a_mw.jpeg
    主なアイテムの詳細
    状態：

    Used

    稼働ステータス:

    不明

    製品ID：

    59344

    ウェーハサイズ：

    不明

    ヴィンテージ：

    不明

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The Cameca IMS 4F is the successor to the IMS 3F and contains all the features of its predecessor plus improvements of the basic instrument as well as new accessories. It is an ion microprobe that is based on the phenomenon of ion-induced sputtering of a solid sample by an energetic primary ion beam, typically consisting of oxygen or cesium ions at beam energy of 5 – 20 keV. It is a tool for investigating isotopic composition in the chemical, material, geological and biological sciences and can detect all elements (H to U) in depth profiling, surface, bulk and microanalysis modes.
    ドキュメント
    ファイルアイコン

    Cameca IMS 4F.pdf

    同様のリスト
    すべて表示
    CAMECA IMS-4F

    CAMECA

    IMS-4F

    Metrologyヴィンテージ： 0状態： 中古最終検証： 60日以上前