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CAMECA IMS-6f
    説明
    SIMS
    構成
    IMS6F
    OEMモデルの説明
    The CAMECA IMS-6f is an ultra-high vacuum (UHV) system designed for secondary ion mass spectrometry (SIMS) analysis. Equipped with a magnetic sector analyzer, it offers exceptional mass resolving power, with a minimum m/Dm of 25000 (10% definition). The system features a duoplasmatron source that can produce O2+ or O- ions, and a microbeam source for Cs+ ions, providing premium beam stability and ultra-fine minimum beam size (300nm for O2+ and 200nm for Cs+). Key capabilities of the IMS-6f include low detection limits and high resolving power in depth profiling, ultra-shallow depth profiling, 3D ion imaging, and excellent charge neutralization, making it an advanced tool for studying material surfaces and interfaces at the nanoscale.
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    CAMECA

    IMS-6f

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    検証済み

    カテゴリ
    Metrology

    最終検証: 30日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    102404


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明

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    同様のリスト
    すべて表示
    CAMECA IMS-6f

    CAMECA

    IMS-6f

    Metrology
    ヴィンテージ: 2002状態: 中古
    最終確認4日前

    CAMECA

    IMS-6f

    verified-listing-icon
    検証済み
    カテゴリ
    Metrology
    最終検証: 30日以上前
    listing-photo-1393a28d6cbe45b89195b491797333a3-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    102404


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    SIMS
    構成
    IMS6F
    OEMモデルの説明
    The CAMECA IMS-6f is an ultra-high vacuum (UHV) system designed for secondary ion mass spectrometry (SIMS) analysis. Equipped with a magnetic sector analyzer, it offers exceptional mass resolving power, with a minimum m/Dm of 25000 (10% definition). The system features a duoplasmatron source that can produce O2+ or O- ions, and a microbeam source for Cs+ ions, providing premium beam stability and ultra-fine minimum beam size (300nm for O2+ and 200nm for Cs+). Key capabilities of the IMS-6f include low detection limits and high resolving power in depth profiling, ultra-shallow depth profiling, 3D ion imaging, and excellent charge neutralization, making it an advanced tool for studying material surfaces and interfaces at the nanoscale.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    CAMECA IMS-6f

    CAMECA

    IMS-6f

    Metrologyヴィンテージ: 2002状態: 中古最終検証: 4日前
    CAMECA IMS-6f

    CAMECA

    IMS-6f

    Metrologyヴィンテージ: 0状態: 中古最終検証: 30日以上前
    CAMECA IMS-6f

    CAMECA

    IMS-6f

    Metrologyヴィンテージ: 0状態: 中古最終検証: 30日以上前