メインコンテンツにスキップ
Moov logo

Moov Icon
KLA QUANTOX
    説明
    Machines - KLA AOI Detailed structure of the unit & quantity Detailed Unit Description - Robot x2 AOI x1 Equipment capabilities Equipment Capabilities - Optical resolution: 2um Robot (LD/ULD) - 1
    構成
    構成なし
    OEMモデルの説明
    Quantox® is a metrology system designed to measure the electrical performance of gate dielectric films in integrated circuits. The quality of the gate dielectric is crucial for the speed and reliability of the circuit. By measuring key parameters such as contamination levels and oxide thickness, Quantox® helps to control the gate dielectric process and maximize device yield. The system is non-contact, ensuring accurate and reliable measurements.
    ドキュメント

    ドキュメントなし

    verified-listing-icon

    検証済み

    カテゴリ
    Metrology

    最終検証: 8日前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    145508


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    KLA QUANTOX

    KLA

    QUANTOX

    Metrology
    ヴィンテージ: 0状態: 中古
    最終確認8日前

    KLA

    QUANTOX

    verified-listing-icon
    検証済み
    カテゴリ
    Metrology
    最終検証: 8日前
    listing-photo-0cfbba9f2b604abfa284044f26b1b22e-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/76253/0cfbba9f2b604abfa284044f26b1b22e/6ba9e4035d9142c9b628afb6f6289d1a_756760bb4c5d41ee85fe7ce4028bd09a_mw.jpeg
    listing-photo-0cfbba9f2b604abfa284044f26b1b22e-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/76253/0cfbba9f2b604abfa284044f26b1b22e/8fd8be141e744c28b0b83688c5be5d27_2778002fbab247daae76bfc0045e07b11201a_mw.jpeg
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    145508


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    Machines - KLA AOI Detailed structure of the unit & quantity Detailed Unit Description - Robot x2 AOI x1 Equipment capabilities Equipment Capabilities - Optical resolution: 2um Robot (LD/ULD) - 1
    構成
    構成なし
    OEMモデルの説明
    Quantox® is a metrology system designed to measure the electrical performance of gate dielectric films in integrated circuits. The quality of the gate dielectric is crucial for the speed and reliability of the circuit. By measuring key parameters such as contamination levels and oxide thickness, Quantox® helps to control the gate dielectric process and maximize device yield. The system is non-contact, ensuring accurate and reliable measurements.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    KLA QUANTOX

    KLA

    QUANTOX

    Metrologyヴィンテージ: 0状態: 中古最終検証:8日前