MCV 2500
カテゴリ
Metrology概要（Overview）
The MCV automatic mapping systems provide a Mercury C-V measurement for non-patterned wafers used in epitaxial silicon production and front-end semiconductor processing.
現在の掲載品
2
サービス
検査、保証、鑑定、ロジスティクス
6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
Messages
Messages
Messages including contact info may not be shared. We scan, review, and reserve the right to remove sensitive information from all messages to prevent fraud and policy violations.All messages subject to review, review our policy for more info.
6" Fab For Sale from Moov - Click Here to Learn More
