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SSM 5200
    説明
    Automatic CV System for CV/QV/IV measurement
    構成
    構成なし
    OEMモデルの説明
    The SSM 5200 is an off-line metrology system that measures a variety of electrical oxide and dielectric characteristics on monitor wafers. It can measure capacitive effective thickness and equivalent oxide thickness of advanced gate dielectrics less than 1 nanometer thick with high precision. It also includes a wide range of current voltage (IV) measurements such as leakage current, TDDB, and SILC. The SSM 5200 uses a small elastic probe to form a temporary gate on the dielectric surface and an integrated pattern recognition system to locate scribe line test areas. The elastic probe has a diameter of less than 30 µm and does not damage the dielectric surface.
    ドキュメント

    ドキュメントなし

    SSM

    5200

    verified-listing-icon

    検証済み

    カテゴリ
    Metrology

    最終検証: 30日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    115106


    ウェーハサイズ:

    8"/200mm


    ヴィンテージ:

    1997


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    SSM 5200

    SSM

    5200

    Metrology
    ヴィンテージ: 1997状態: 中古
    最終確認60日以上前

    SSM

    5200

    verified-listing-icon
    検証済み
    カテゴリ
    Metrology
    最終検証: 30日以上前
    listing-photo-53c4fe85bf2d4c878760945f9fd103c9-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/53c4fe85bf2d4c878760945f9fd103c9/54cf81f64b904a789cb2c20815f57373_1a_mw.png
    listing-photo-53c4fe85bf2d4c878760945f9fd103c9-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/53c4fe85bf2d4c878760945f9fd103c9/957e957f2ffa46f5b36146f22b0b4c97_2a_mw.png
    listing-photo-53c4fe85bf2d4c878760945f9fd103c9-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/53c4fe85bf2d4c878760945f9fd103c9/0de57d9c06974b2aae2001909a4b4901_1c_mw.png
    listing-photo-53c4fe85bf2d4c878760945f9fd103c9-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/53c4fe85bf2d4c878760945f9fd103c9/124fda7fa3c4437d9838a8e8616cc10c_1b_mw.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    115106


    ウェーハサイズ:

    8"/200mm


    ヴィンテージ:

    1997


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    Automatic CV System for CV/QV/IV measurement
    構成
    構成なし
    OEMモデルの説明
    The SSM 5200 is an off-line metrology system that measures a variety of electrical oxide and dielectric characteristics on monitor wafers. It can measure capacitive effective thickness and equivalent oxide thickness of advanced gate dielectrics less than 1 nanometer thick with high precision. It also includes a wide range of current voltage (IV) measurements such as leakage current, TDDB, and SILC. The SSM 5200 uses a small elastic probe to form a temporary gate on the dielectric surface and an integrated pattern recognition system to locate scribe line test areas. The elastic probe has a diameter of less than 30 µm and does not damage the dielectric surface.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    SSM 5200

    SSM

    5200

    Metrologyヴィンテージ: 1997状態: 中古最終検証:60日以上前
    SSM 5200

    SSM

    5200

    Metrologyヴィンテージ: 1997状態: 中古最終検証:30日以上前
    SSM 5200

    SSM

    5200

    Metrologyヴィンテージ: 2008状態: 中古最終検証:30日以上前