説明
REGISTRATION & OPTICAL CD構成
構成なしOEMモデルの説明
PROVE® the next generation registration and overlay metrology system was successfully introduced into the market in 2010. It enables in-die measurement capability by means of high-resolution 193 nm optics, as well as optimized illumination for best contrast and pellicle compatibility.ドキュメント
ドキュメントなし
ZEISS / CARL ZEISS
PROVE
検証済み
カテゴリ
Metrology
最終検証: 23日前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
73742
ウェーハサイズ:
不明
ヴィンテージ:
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ZEISS / CARL ZEISS
PROVE
カテゴリ
Metrology
最終検証: 23日前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
73742
ウェーハサイズ:
不明
ヴィンテージ:
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
REGISTRATION & OPTICAL CD構成
構成なしOEMモデルの説明
PROVE® the next generation registration and overlay metrology system was successfully introduced into the market in 2010. It enables in-die measurement capability by means of high-resolution 193 nm optics, as well as optimized illumination for best contrast and pellicle compatibility.ドキュメント
ドキュメントなし