説明
説明なし構成
• Elstar FEG Electron column, 350v–30kV • In-lens SE and BSE detector and STEM • Elstar Electron column is capable of sub-nanometer STEM images • Sidewinder Ion column: 30kV • Milling Power: 21nA beam current • CDEM with 5nm image resolution • Windows OS and FEI UI • Five-axis motorized compucentric stage with load lock • Specimen Coverage: 100mm diameter • Load Lock • Chamber scope for real time observation • Gas Injection System (GIS): Max 4 injectors 2 included, chemistry of choice • Vacuum System, oil free consisting IGP x 3, air cooled Turbo and dry PVPOEMモデルの説明
The Helios NanoLab 400 is a DualBeam system that integrates both ion and electron beams for Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM) functionality in one machine. This allows users to switch between the two beams for quick and accurate navigation and milling. The convergence of the SEM and FIB at a short working distance enables precision “slice-and-view” cross-sectioning and analysis at high resolution. This system provides a powerful tool for sample preparation and analysis.ドキュメント
ドキュメントなし
THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
HELIOS NANOLAB 400
検証済み
カテゴリ
Microscope
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
13114
ウェーハサイズ：
不明
ヴィンテージ：
2015
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
HELIOS NANOLAB 400
カテゴリ
Microscope
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
13114
ウェーハサイズ：
不明
ヴィンテージ：
2015
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
• Elstar FEG Electron column, 350v–30kV • In-lens SE and BSE detector and STEM • Elstar Electron column is capable of sub-nanometer STEM images • Sidewinder Ion column: 30kV • Milling Power: 21nA beam current • CDEM with 5nm image resolution • Windows OS and FEI UI • Five-axis motorized compucentric stage with load lock • Specimen Coverage: 100mm diameter • Load Lock • Chamber scope for real time observation • Gas Injection System (GIS): Max 4 injectors 2 included, chemistry of choice • Vacuum System, oil free consisting IGP x 3, air cooled Turbo and dry PVPOEMモデルの説明
The Helios NanoLab 400 is a DualBeam system that integrates both ion and electron beams for Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM) functionality in one machine. This allows users to switch between the two beams for quick and accurate navigation and milling. The convergence of the SEM and FIB at a short working distance enables precision “slice-and-view” cross-sectioning and analysis at high resolution. This system provides a powerful tool for sample preparation and analysis.ドキュメント
ドキュメントなし