説明
説明なし構成
1. Eyepiece: CFI 10X/22 2. Observation tube: three-eye observation tube 3. Nose wheel: manual nose wheel 4. Upper light source: 12V-50W light house light source 5. The fuselage has the function of switching between light and dark field of view 6. Objective lens: 5X. 10X. 20X. 50X 7. CCD adapter mirror8. Mobile bed: 6X4 STAGEOEMモデルの説明
The microscope is primarily intended for inspection of wafers or chips after development and/or evaporation. It is equipped with an incident (epi) illuminating unit (light is coming from above the specimen) with a Differential Interference Contrast option. It is also equipped with Dark Field option.ドキュメント
ドキュメントなし
NIKON
ECLIPSE ME600
検証済み
カテゴリ
Microscope
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
75317
ウェーハサイズ：
不明
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
NIKON
ECLIPSE ME600
検証済み
カテゴリ
Microscope
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
75317
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
1. Eyepiece: CFI 10X/22 2. Observation tube: three-eye observation tube 3. Nose wheel: manual nose wheel 4. Upper light source: 12V-50W light house light source 5. The fuselage has the function of switching between light and dark field of view 6. Objective lens: 5X. 10X. 20X. 50X 7. CCD adapter mirror8. Mobile bed: 6X4 STAGEOEMモデルの説明
The microscope is primarily intended for inspection of wafers or chips after development and/or evaporation. It is equipped with an incident (epi) illuminating unit (light is coming from above the specimen) with a Differential Interference Contrast option. It is also equipped with Dark Field option.ドキュメント
ドキュメントなし