説明
説明なし構成
構成なしOEMモデルの説明
Long 1000 x 800 mm stage stroke provides maximum performance in the measurement of large-size workpieces such as FPD devices. Printing masks for substrates. Mother substrates for PCBs. Shadow masks. FPD devices. Long stage stroke enables measurements of LCD substrates/modules and large-size PCBs. Laser AF also enables measurements of height gaps and warping in workpieces. Search function enables measurements of lands and holes of PCBs. Variety of illumination choices facilitate accurate edge detection even for vague geometries. High-speed stage and high-speed image processing provide high throughput.ドキュメント
ドキュメントなし
カテゴリ
Microscope
最終検証： 4日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
156811
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
NIKON
NEXIV VMR-10080
カテゴリ
Microscope
最終検証： 4日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
156811
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
構成なしOEMモデルの説明
Long 1000 x 800 mm stage stroke provides maximum performance in the measurement of large-size workpieces such as FPD devices. Printing masks for substrates. Mother substrates for PCBs. Shadow masks. FPD devices. Long stage stroke enables measurements of LCD substrates/modules and large-size PCBs. Laser AF also enables measurements of height gaps and warping in workpieces. Search function enables measurements of lands and holes of PCBs. Variety of illumination choices facilitate accurate edge detection even for vague geometries. High-speed stage and high-speed image processing provide high throughput.ドキュメント
ドキュメントなし