説明
D3100S-1 Atomic Force Microscope (AFM) Key Features : . Scans samples up to 8 inch . Little or no sample preparation for increased productivity . Rigid ,low vibration construction for superior image quality . Integrated top-view color video optics with 1.5 um resolution and zoom . Easily changes among all AFM/STM scanning modes/techniques without tools . Automated stepping for scanning multiple areas unattended . Trakscan laser tracking system improves image and measurement quality . Laser spot alignment window for easy setup . Superior resolution and linearity in all three dimensions *. Fully refurbished. *. Installed in Clean-room. *. Can demonstrate any time.構成
- Dimension SPM Head - X-Y imaging area approx. 90um square - Z range approx. 6 um - Lateral accuracy typically within 1%, maximum 2% - Standard 150mm vacuum chuck for 100mm,125mm,150mm wafers - Optional 200mm vacuum chuck for 150mm and 200mm wafers - Inspectable Area 125x100mm ; allows coverage of one-half of 150mm wafer without manual sample rotation Full wafer with manual rotation - Nanoscope Dimension 3100 Controller - Nanoscope IIIa Scanning Probe Microscope Controller - System Computer - TMC Micro-G Isolation TableOEMモデルの説明
The Dimension 3100 Scanning Probe Microscope (SPM) is a high-resolution imaging device that produces three-dimensional images of a sample surface. The microscope works by scanning a sharp tip, mounted on a flexible cantilever, over the sample surface. The cantilever is attached to one end of a cylindrical piezoelectric tube, which is mounted near the top of the microscope. By applying voltages to the X, Y, and Z electrodes on the piezoelectric tube, the tube can be deflected horizontally and vertically to produce a precise raster scan over the sample surface. A stepper motor translates a slide with the sample attached, while a separate motor drive controls the height of the microscope and tip relative to the sample surface. This allows for accurate and detailed imaging of the sample surface.ドキュメント
ドキュメントなし
VEECO / DIGITAL INSTRUMENTS
DIMENSION 3100
検証済み
カテゴリ
Microscope
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
102010
ウェーハサイズ：
8"/200mm
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
VEECO / DIGITAL INSTRUMENTS
DIMENSION 3100
カテゴリ
Microscope
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
102010
ウェーハサイズ：
8"/200mm
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
D3100S-1 Atomic Force Microscope (AFM) Key Features : . Scans samples up to 8 inch . Little or no sample preparation for increased productivity . Rigid ,low vibration construction for superior image quality . Integrated top-view color video optics with 1.5 um resolution and zoom . Easily changes among all AFM/STM scanning modes/techniques without tools . Automated stepping for scanning multiple areas unattended . Trakscan laser tracking system improves image and measurement quality . Laser spot alignment window for easy setup . Superior resolution and linearity in all three dimensions *. Fully refurbished. *. Installed in Clean-room. *. Can demonstrate any time.構成
- Dimension SPM Head - X-Y imaging area approx. 90um square - Z range approx. 6 um - Lateral accuracy typically within 1%, maximum 2% - Standard 150mm vacuum chuck for 100mm,125mm,150mm wafers - Optional 200mm vacuum chuck for 150mm and 200mm wafers - Inspectable Area 125x100mm ; allows coverage of one-half of 150mm wafer without manual sample rotation Full wafer with manual rotation - Nanoscope Dimension 3100 Controller - Nanoscope IIIa Scanning Probe Microscope Controller - System Computer - TMC Micro-G Isolation TableOEMモデルの説明
The Dimension 3100 Scanning Probe Microscope (SPM) is a high-resolution imaging device that produces three-dimensional images of a sample surface. The microscope works by scanning a sharp tip, mounted on a flexible cantilever, over the sample surface. The cantilever is attached to one end of a cylindrical piezoelectric tube, which is mounted near the top of the microscope. By applying voltages to the X, Y, and Z electrodes on the piezoelectric tube, the tube can be deflected horizontally and vertically to produce a precise raster scan over the sample surface. A stepper motor translates a slide with the sample attached, while a separate motor drive controls the height of the microscope and tip relative to the sample surface. This allows for accurate and detailed imaging of the sample surface.ドキュメント
ドキュメントなし