説明
Atomic Force Microscope構成
NanoScope Illa SPM SystemOEMモデルの説明
The Dimension 3100 Scanning Probe Microscope (SPM) is a high-resolution imaging device that produces three-dimensional images of a sample surface. The microscope works by scanning a sharp tip, mounted on a flexible cantilever, over the sample surface. The cantilever is attached to one end of a cylindrical piezoelectric tube, which is mounted near the top of the microscope. By applying voltages to the X, Y, and Z electrodes on the piezoelectric tube, the tube can be deflected horizontally and vertically to produce a precise raster scan over the sample surface. A stepper motor translates a slide with the sample attached, while a separate motor drive controls the height of the microscope and tip relative to the sample surface. This allows for accurate and detailed imaging of the sample surface.ドキュメント
ドキュメントなし
VEECO / DIGITAL INSTRUMENTS
DIMENSION 3100
検証済み
カテゴリ
Microscope
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
72710
ウェーハサイズ：
不明
ヴィンテージ：
2006
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
VEECO / DIGITAL INSTRUMENTS
DIMENSION 3100
カテゴリ
Microscope
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
72710
ウェーハサイズ：
不明
ヴィンテージ：
2006
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Atomic Force Microscope構成
NanoScope Illa SPM SystemOEMモデルの説明
The Dimension 3100 Scanning Probe Microscope (SPM) is a high-resolution imaging device that produces three-dimensional images of a sample surface. The microscope works by scanning a sharp tip, mounted on a flexible cantilever, over the sample surface. The cantilever is attached to one end of a cylindrical piezoelectric tube, which is mounted near the top of the microscope. By applying voltages to the X, Y, and Z electrodes on the piezoelectric tube, the tube can be deflected horizontally and vertically to produce a precise raster scan over the sample surface. A stepper motor translates a slide with the sample attached, while a separate motor drive controls the height of the microscope and tip relative to the sample surface. This allows for accurate and detailed imaging of the sample surface.ドキュメント
ドキュメントなし