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KLA ARCHER AIM
    説明
    Overlay measurement system
    構成
    構成なし
    OEMモデルの説明
    Archer AIM is an Advanced Optical Overlay Metrology product that improves stepper correction accuracy, provides precise data, and enables design rule segmentation. It delivers industry-leading precision performance, reduces total measurement uncertainty, and increases sampling rate. It also includes offline automatic recipe creation and real-time analysis software. The MPX option enables ‘on product’ monitoring of focus-exposure. Archer AIM targets new standards for lithography process control for 65-nm and beyond, reducing measurement uncertainty and enabling control of overlay error budgets. It integrates with KLA-Tencor’s software management products to provide comprehensive optical overlay metrology process control.
    ドキュメント

    ドキュメントなし

    KLA

    ARCHER AIM

    verified-listing-icon

    検証済み

    カテゴリ
    Overlay

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    49249


    ウェーハサイズ:

    12"/300mm


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    KLA ARCHER AIM

    KLA

    ARCHER AIM

    Overlay
    ヴィンテージ: 2004状態: 中古
    最終確認60日以上前

    KLA

    ARCHER AIM

    verified-listing-icon
    検証済み
    カテゴリ
    Overlay
    最終検証: 60日以上前
    listing-photo-f1901bb7ddf148609afd2ae629b73935-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    49249


    ウェーハサイズ:

    12"/300mm


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    Overlay measurement system
    構成
    構成なし
    OEMモデルの説明
    Archer AIM is an Advanced Optical Overlay Metrology product that improves stepper correction accuracy, provides precise data, and enables design rule segmentation. It delivers industry-leading precision performance, reduces total measurement uncertainty, and increases sampling rate. It also includes offline automatic recipe creation and real-time analysis software. The MPX option enables ‘on product’ monitoring of focus-exposure. Archer AIM targets new standards for lithography process control for 65-nm and beyond, reducing measurement uncertainty and enabling control of overlay error budgets. It integrates with KLA-Tencor’s software management products to provide comprehensive optical overlay metrology process control.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    KLA ARCHER AIM

    KLA

    ARCHER AIM

    Overlayヴィンテージ: 2004状態: 中古最終検証:60日以上前
    KLA ARCHER AIM

    KLA

    ARCHER AIM

    Overlayヴィンテージ: 0状態: 中古最終検証:60日以上前
    KLA ARCHER AIM

    KLA

    ARCHER AIM

    Overlayヴィンテージ: 2003状態: 中古最終検証:60日以上前