説明
Suss MicroTec PA300 ProbeShield Probing Station, 115V, 60Hz, w/ Seiwa Optical Correct probing microscope, SenTech STC-630AS camera, FWF10x eyepieces, Mplan Apo 2x/0.55 objective, Mplan Apo 10x/0.28 objective, temp-controlled 12in vacuum chuck, Cascade ProberBench II electronics module. Mfg 2008. Includes: Cascade ProberBench Joystick Controller 2; 2ea GBB PicoProbe power supplies; 4ea FormFactor DPP210 micromanipulators; Dell control PC; LED F3000 illumination source; ATT A300 temperature controller . 58in x 40in x 66in H.構成
構成なしOEMモデルの説明
The PA300 is an analytical prober conforming to EN 61010 - 1: 1993-04 which corresponds to UL 3101-1: 1993 and IEC 1010-1: 1992. By means of the PA300 electrical measurements on wafers and substrates up to a diameter of 300mm can be made. The only electrical connection to the measuring object is through the probecard, the probehead and the chuck.ドキュメント
ドキュメントなし
カテゴリ
Probers
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
123851
ウェーハサイズ：
不明
ヴィンテージ：
2008
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
SUSS MicroTec / KARL SUSS
PA300
カテゴリ
Probers
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
123851
ウェーハサイズ：
不明
ヴィンテージ：
2008
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Suss MicroTec PA300 ProbeShield Probing Station, 115V, 60Hz, w/ Seiwa Optical Correct probing microscope, SenTech STC-630AS camera, FWF10x eyepieces, Mplan Apo 2x/0.55 objective, Mplan Apo 10x/0.28 objective, temp-controlled 12in vacuum chuck, Cascade ProberBench II electronics module. Mfg 2008. Includes: Cascade ProberBench Joystick Controller 2; 2ea GBB PicoProbe power supplies; 4ea FormFactor DPP210 micromanipulators; Dell control PC; LED F3000 illumination source; ATT A300 temperature controller . 58in x 40in x 66in H.構成
構成なしOEMモデルの説明
The PA300 is an analytical prober conforming to EN 61010 - 1: 1993-04 which corresponds to UL 3101-1: 1993 and IEC 1010-1: 1992. By means of the PA300 electrical measurements on wafers and substrates up to a diameter of 300mm can be made. The only electrical connection to the measuring object is through the probecard, the probehead and the chuck.ドキュメント
ドキュメントなし