説明

TEL Prober Docked Teradyne Tester IP750EP, J750EX SACC (cart move type) Hot Chuck (Nickel) Needle Cleaning Unit (150mm x 150mm) GPIB interface Temperature range : based on the configuration. (Hot only)

構成

構成なし

OEMモデルの説明

Precio nano™ is a 300mm wafer prober that realizes high accuracy contact and cleanness under high load. In the probing process, demand for probing technology has diversified as process miniaturization, high function/high integration devices and packages are changing.