説明
説明なし構成
Condition : Fully operational, Tested Specification : 100% OEM specs Configuration : XP Computer , Software 7.45, XT head (long range), up to 200 mm Includes Step height for calibration Inspection arrangeable? : yes (Including Power Inspection)OEMモデルの説明
The P-16+ stylus profiler is a surface metrology analysis solution used in a wide range of applications and industries, from R&D; departments and universities to production and process monitoring. This surface analysis solution's precise force control provides excellent vertical resolution, precision, and reliability measurements. This surface analysis solution delivers automated step height analysis, surface contour, waviness and roughness measurements with detailed 2D or 3D analysis of topography for a variety of surfaces and materials.ドキュメント
ドキュメントなし
KLA
P-16+
検証済み
カテゴリ
Profiler
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
49721
ウェーハサイズ:
不明
ヴィンテージ:
2013
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示KLA
P-16+
検証済み
カテゴリ
Profiler
最終検証: 60日以上前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
49721
ウェーハサイズ:
不明
ヴィンテージ:
2013
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
Condition : Fully operational, Tested Specification : 100% OEM specs Configuration : XP Computer , Software 7.45, XT head (long range), up to 200 mm Includes Step height for calibration Inspection arrangeable? : yes (Including Power Inspection)OEMモデルの説明
The P-16+ stylus profiler is a surface metrology analysis solution used in a wide range of applications and industries, from R&D; departments and universities to production and process monitoring. This surface analysis solution's precise force control provides excellent vertical resolution, precision, and reliability measurements. This surface analysis solution delivers automated step height analysis, surface contour, waviness and roughness measurements with detailed 2D or 3D analysis of topography for a variety of surfaces and materials.ドキュメント
ドキュメントなし