説明
The KLA-Tencor P-16+ Profiler is a highly sensitive surface profiler that measures step height, roughness, and waviness on sample surfaces. *. To be refurbished. *. Installed in Clean-room. *. Can demonstrate any time.構成
•; Microhead 5 •; Dual view optic (Top & side) •; Lens : 6.4X , Magnification Range : 300X~1012X •; Repeatability : 6 Å;; or 0.1% (1 s).OEMモデルの説明
The P-16+ stylus profiler is a surface metrology analysis solution used in a wide range of applications and industries, from R&D; departments and universities to production and process monitoring. This surface analysis solution's precise force control provides excellent vertical resolution, precision, and reliability measurements. This surface analysis solution delivers automated step height analysis, surface contour, waviness and roughness measurements with detailed 2D or 3D analysis of topography for a variety of surfaces and materials.ドキュメント
ドキュメントなし
KLA
P-16+
検証済み
カテゴリ
Profiler
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
78416
ウェーハサイズ：
8"/200mm
ヴィンテージ：
2012
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
P-16+
カテゴリ
Profiler
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
78416
ウェーハサイズ：
8"/200mm
ヴィンテージ：
2012
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
The KLA-Tencor P-16+ Profiler is a highly sensitive surface profiler that measures step height, roughness, and waviness on sample surfaces. *. To be refurbished. *. Installed in Clean-room. *. Can demonstrate any time.構成
•; Microhead 5 •; Dual view optic (Top & side) •; Lens : 6.4X , Magnification Range : 300X~1012X •; Repeatability : 6 Å;; or 0.1% (1 s).OEMモデルの説明
The P-16+ stylus profiler is a surface metrology analysis solution used in a wide range of applications and industries, from R&D; departments and universities to production and process monitoring. This surface analysis solution's precise force control provides excellent vertical resolution, precision, and reliability measurements. This surface analysis solution delivers automated step height analysis, surface contour, waviness and roughness measurements with detailed 2D or 3D analysis of topography for a variety of surfaces and materials.ドキュメント
ドキュメントなし