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6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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KLA P-22
    説明
    説明なし
    構成
    CMP
    OEMモデルの説明
    The P-22 is an automated surface profiler that provides comprehensive surface topography analysis for various applications. It has a built-in vibration isolation system and uses KLA-Tencor’s MicroHead II technology for highly repeatable step height measurements. It can handle wafers of different sizes, provides up to 40 key surface parameters, and has GEM/SECS compliant software for fully automated measurements. Data can be exported as ASCII for easy analysis in other applications.
    ドキュメント

    ドキュメントなし

    KLA

    P-22

    verified-listing-icon

    検証済み

    カテゴリ
    Profiler

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    110176


    ウェーハサイズ:

    8"/200mm


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    KLA P-22

    KLA

    P-22

    Profiler
    ヴィンテージ: 0状態: 改修済み
    最終確認60日以上前

    KLA

    P-22

    verified-listing-icon
    検証済み
    カテゴリ
    Profiler
    最終検証: 60日以上前
    listing-photo-754b298488f24c8da18f2973fac691fe-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    110176


    ウェーハサイズ:

    8"/200mm


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    説明なし
    構成
    CMP
    OEMモデルの説明
    The P-22 is an automated surface profiler that provides comprehensive surface topography analysis for various applications. It has a built-in vibration isolation system and uses KLA-Tencor’s MicroHead II technology for highly repeatable step height measurements. It can handle wafers of different sizes, provides up to 40 key surface parameters, and has GEM/SECS compliant software for fully automated measurements. Data can be exported as ASCII for easy analysis in other applications.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    KLA P-22

    KLA

    P-22

    Profilerヴィンテージ: 0状態: 改修済み最終検証:60日以上前
    KLA P-22

    KLA

    P-22

    Profilerヴィンテージ: 0状態: 中古最終検証:20日前
    KLA P-22

    KLA

    P-22

    Profilerヴィンテージ: 0状態: 中古最終検証:60日以上前