説明
- Measurement Type: Stylus surface profiling (2D scan) - XY Stage: Manual stage, supports up to 150 mm wafers - OS: Windows XP - KLA OS: Profiler V7.35 - Microhead SR - Software: Profiler Application pre-installed on PC - Optics: Video camera with zoom/focus - Monitor, Windows PC, Keyboard & Mouse: Included構成
構成なしOEMモデルの説明
In July 2008, KLA launched the P-6 system which provides stylus profiling and analysis of surface topography, for issues such as roughness, film stress and curvature, in an economical benchtop design for samples up to 150mm.ドキュメント
ドキュメントなし
KLA
P-6
カテゴリ
Profiler
最終検証： 2日前
主なアイテムの詳細
状態：
Refurbished
稼働ステータス:
不明
製品ID：
140006
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
- Measurement Type: Stylus surface profiling (2D scan) - XY Stage: Manual stage, supports up to 150 mm wafers - OS: Windows XP - KLA OS: Profiler V7.35 - Microhead SR - Software: Profiler Application pre-installed on PC - Optics: Video camera with zoom/focus - Monitor, Windows PC, Keyboard & Mouse: Included構成
構成なしOEMモデルの説明
In July 2008, KLA launched the P-6 system which provides stylus profiling and analysis of surface topography, for issues such as roughness, film stress and curvature, in an economical benchtop design for samples up to 150mm.ドキュメント
ドキュメントなし