説明
説明なし構成
構成なしOEMモデルの説明
The Tencor HRP-200 High-Resolution Profiler is a fully-automated system that provides global and local analysis of wafer surface topography. It can measure surface topography on both macroscopic and microscopic scales, combining long scans with fine-area analysis of submicron features. It allows process engineers to quickly compare feature depths and relative surface heights. It also combines the measurement repeatability and ease of use of a Tencor stylus profiler with the high-resolution analysis and imaging capabilities of an Atomic Force Microscope (AFM).ドキュメント
ドキュメントなし
KLA
HRP-200
カテゴリ
Profiler
最終検証： 5日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
154851
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
構成なしOEMモデルの説明
The Tencor HRP-200 High-Resolution Profiler is a fully-automated system that provides global and local analysis of wafer surface topography. It can measure surface topography on both macroscopic and microscopic scales, combining long scans with fine-area analysis of submicron features. It allows process engineers to quickly compare feature depths and relative surface heights. It also combines the measurement repeatability and ease of use of a Tencor stylus profiler with the high-resolution analysis and imaging capabilities of an Atomic Force Microscope (AFM).ドキュメント
ドキュメントなし