説明
説明なし構成
lon Column: Magnum- i-Source: Ga LMIS. KV: 30kV.- • Вс: 21лA — 11nА Detector • In chamber: CDEM Chamber & Stage. 5-axes motorized, tilt eucentric Full coverage of 200mm diameter. Gas Injection System (GIS) • 1 GIS : Pt, (Including a matching controller). Microscope Control • Windows NT- Vacuum System • Pumps: ( Molecular Pump) ),RV8(Edward vacuum-pump RVB)-OEMモデルの説明
The FEI FIB 800 is a state-of-the-art Focused Ion Beam (FIB) system that is utilized for a variety of applications, including circuit editing, defect and failure analysis, TEM lamella preparation, nanofabrication, nanoprototyping, and MEMS. It employs a Magnum ion column and boasts a milling power of 21nA beam current. The system can accommodate samples with diameters up to 200mm and features a 5-axis motorized eucentric tilt stage. Additionally, it includes a gas injection system with up to four injectors and a vacuum system with column IGP, air-cooled Turbo, and mechanical PVP.ドキュメント
カテゴリ
SEM / FIB
最終検証： 6日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
138233
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
THERMOFISHER SCIENTIFIC / FEI / PHILIPS
FIB 800
カテゴリ
SEM / FIB
最終検証： 6日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
138233
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available