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説明
Spare Parts None available構成
Model Nova NanoSEM 600 w/ Gatan MonoCL Software Version 1.3.5 Build 758 Process SEM/CL Wafer Config & Size 150mm wafers and pieces, Partial analysis of 200mm wafers Chillers one closed-loop chiller, Haskris Roughing Pump Edwards 10i roughing pump UPS Toshiba SEM detectors (internal) Everhart-Thornley SE (1) and Thru-the-Lens Detector (1) SEM detectors (external) Helix (1), Low Vacuum Detector (1) & Gaseous Analytical (1) Cathodoluminescece (CL) Detector Gatan MonoCL3 Chamber Plasma Cleaner XEI Scientific Evactron E50 Chamber DecontaminatorOEMモデルの説明
The Nova NanoSEM 600 is a type of high-resolution scanning electron microscope (SEM) that comes equipped with SED, BSED, and STEM detectors. It is a Dual Beam SEM/FIB system that combines the capabilities of ultra-high resolution field emission Scanning Electron Microscopy (SEM) with the precision of Focused Ion Beam (FIB) etching and deposition, making it ideal for nanoscale prototyping, machining, characterization, and analysis. When operating in STEM mode, this microscope can achieve a resolution as low as 1 nanometer. Additionally, the Nova NanoSEM 600 is capable of operating under low vacuum conditions and offers a range of analytical options including EBSD and EDS.ドキュメント
ドキュメントなし
カテゴリ
SEM / FIB
最終検証： 5日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
125842
ウェーハサイズ：
不明
ヴィンテージ：
2005
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
NOVA NANOSEM 600
カテゴリ
SEM / FIB
最終検証： 5日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
125842
ウェーハサイズ：
不明
ヴィンテージ：
2005
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Spare Parts None available構成
Model Nova NanoSEM 600 w/ Gatan MonoCL Software Version 1.3.5 Build 758 Process SEM/CL Wafer Config & Size 150mm wafers and pieces, Partial analysis of 200mm wafers Chillers one closed-loop chiller, Haskris Roughing Pump Edwards 10i roughing pump UPS Toshiba SEM detectors (internal) Everhart-Thornley SE (1) and Thru-the-Lens Detector (1) SEM detectors (external) Helix (1), Low Vacuum Detector (1) & Gaseous Analytical (1) Cathodoluminescece (CL) Detector Gatan MonoCL3 Chamber Plasma Cleaner XEI Scientific Evactron E50 Chamber DecontaminatorOEMモデルの説明
The Nova NanoSEM 600 is a type of high-resolution scanning electron microscope (SEM) that comes equipped with SED, BSED, and STEM detectors. It is a Dual Beam SEM/FIB system that combines the capabilities of ultra-high resolution field emission Scanning Electron Microscopy (SEM) with the precision of Focused Ion Beam (FIB) etching and deposition, making it ideal for nanoscale prototyping, machining, characterization, and analysis. When operating in STEM mode, this microscope can achieve a resolution as low as 1 nanometer. Additionally, the Nova NanoSEM 600 is capable of operating under low vacuum conditions and offers a range of analytical options including EBSD and EDS.ドキュメント
ドキュメントなし