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説明
-fully functional -ready to install within 2 weeks. -professionally refurbished: replacing all the vacuum hoses. Doing a thorough inspection of it, alignment, and making sure that everything functions properly. The vacuum pump will be rebuilt, and all systems will be completely checked.構成
It is currently configured with backscatter, in-lens, and lower secondary detectors. It is a variable pressure system. Can be sold with EDS with an additional cost as it would be a new system from IXRF.OEMモデルの説明
The Nova NanoSEM 600 is a type of high-resolution scanning electron microscope (SEM) that comes equipped with SED, BSED, and STEM detectors. It is a Dual Beam SEM/FIB system that combines the capabilities of ultra-high resolution field emission Scanning Electron Microscopy (SEM) with the precision of Focused Ion Beam (FIB) etching and deposition, making it ideal for nanoscale prototyping, machining, characterization, and analysis. When operating in STEM mode, this microscope can achieve a resolution as low as 1 nanometer. Additionally, the Nova NanoSEM 600 is capable of operating under low vacuum conditions and offers a range of analytical options including EBSD and EDS.ドキュメント
ドキュメントなし
カテゴリ
SEM / FIB
最終検証： 30日以上前
主なアイテムの詳細
状態：
Refurbished
稼働ステータス:
不明
製品ID：
111835
ウェーハサイズ：
不明
ヴィンテージ：
2009
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
NOVA NANOSEM 600
カテゴリ
SEM / FIB
最終検証： 30日以上前
主なアイテムの詳細
状態：
Refurbished
稼働ステータス:
不明
製品ID：
111835
ウェーハサイズ：
不明
ヴィンテージ：
2009
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
-fully functional -ready to install within 2 weeks. -professionally refurbished: replacing all the vacuum hoses. Doing a thorough inspection of it, alignment, and making sure that everything functions properly. The vacuum pump will be rebuilt, and all systems will be completely checked.構成
It is currently configured with backscatter, in-lens, and lower secondary detectors. It is a variable pressure system. Can be sold with EDS with an additional cost as it would be a new system from IXRF.OEMモデルの説明
The Nova NanoSEM 600 is a type of high-resolution scanning electron microscope (SEM) that comes equipped with SED, BSED, and STEM detectors. It is a Dual Beam SEM/FIB system that combines the capabilities of ultra-high resolution field emission Scanning Electron Microscopy (SEM) with the precision of Focused Ion Beam (FIB) etching and deposition, making it ideal for nanoscale prototyping, machining, characterization, and analysis. When operating in STEM mode, this microscope can achieve a resolution as low as 1 nanometer. Additionally, the Nova NanoSEM 600 is capable of operating under low vacuum conditions and offers a range of analytical options including EBSD and EDS.ドキュメント
ドキュメントなし