
説明
THERMOFISHER SCIENTIFIC / FEI / PHILIPS Nova 600i NANOLAB Dual Beam FIB/SEM構成
FEI Nova 600i Dual Beam FIB-SEM System: - FEI Nova Dual Beam (FIB + SEM) - Gallium liquid metal ion source (FIB) - Field emission electron source (SEM) Software / automation: - AutoTEM — automated TEM lamella preparation - AutoFIB — automated FIB milling and serial sectioning - AutoScript — scripting environment for custom automation Gas Injection System: - 3-port GIS: Platinum (Pt) / iDep2 / Gold (Au) - Note: originally configured with IEE (XeF₂ etch), modified to Au Micromanipulation: - Omniprobe in-situ micromanipulator Analytical detectors: - EDAX EBSD system — included (not currently installed, available with tool) - EDS — not included (retained by seller)OEMモデルの説明
Nova 600 Nanolab DualBeam-SEM/FIB for Nanoscale Prototyping, Machining, Characterization, and Analysis of Structures below 100 nm.ドキュメント
カテゴリ
SEM / FIB
最終検証: 6日前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
150788
ウェーハサイズ:
不明
ヴィンテージ:
2008
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示THERMOFISHER SCIENTIFIC / FEI / PHILIPS
NOVA 600 NANOLAB
カテゴリ
SEM / FIB
最終検証: 6日前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
150788
ウェーハサイズ:
不明
ヴィンテージ:
2008
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available