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THERMOFISHER SCIENTIFIC / FEI / PHILIPS QUANTA 200
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The Quanta 200 is a type of scanning electron microscope (SEM) that was once manufactured by FEI. This versatile instrument can be used in both high-vacuum and low-vacuum modes, allowing for the imaging of a wide range of samples. The electron beam in the Quanta 200 is produced by a traditional tungsten filament electron source, which can resolve features as small as 3 nm under ideal conditions. The instrument is equipped with standard Secondary Electron (SE) and Back Scatter Electron (BSE) detectors, as well as an Energy Dispersive X-ray Analysis (EDS) detector and an internal TV camera. Some of the Quanta 200’s features include SE, BSE, and EDS detectors; an accelerating voltage range of 200 V to 30 kV; a resolution of 3.0 nm at 30 kV; and a resolution of 10 nm at 3 kV.
    ドキュメント

    ドキュメントなし

    verified-listing-icon

    検証済み

    カテゴリ
    SEM / FIB

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    128719


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    THERMOFISHER SCIENTIFIC / FEI / PHILIPS QUANTA 200

    THERMOFISHER SCIENTIFIC / FEI / PHILIPS

    QUANTA 200

    SEM / FIB
    ヴィンテージ: 0状態: 中古
    最終確認60日以上前

    THERMOFISHER SCIENTIFIC / FEI / PHILIPS

    QUANTA 200

    verified-listing-icon
    検証済み
    カテゴリ
    SEM / FIB
    最終検証: 60日以上前
    listing-photo-1832a299ed0f4717a2b03012ac24991a-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    128719


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The Quanta 200 is a type of scanning electron microscope (SEM) that was once manufactured by FEI. This versatile instrument can be used in both high-vacuum and low-vacuum modes, allowing for the imaging of a wide range of samples. The electron beam in the Quanta 200 is produced by a traditional tungsten filament electron source, which can resolve features as small as 3 nm under ideal conditions. The instrument is equipped with standard Secondary Electron (SE) and Back Scatter Electron (BSE) detectors, as well as an Energy Dispersive X-ray Analysis (EDS) detector and an internal TV camera. Some of the Quanta 200’s features include SE, BSE, and EDS detectors; an accelerating voltage range of 200 V to 30 kV; a resolution of 3.0 nm at 30 kV; and a resolution of 10 nm at 3 kV.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    THERMOFISHER SCIENTIFIC / FEI / PHILIPS QUANTA 200

    THERMOFISHER SCIENTIFIC / FEI / PHILIPS

    QUANTA 200

    SEM / FIBヴィンテージ: 0状態: 中古最終検証:60日以上前
    THERMOFISHER SCIENTIFIC / FEI / PHILIPS QUANTA 200

    THERMOFISHER SCIENTIFIC / FEI / PHILIPS

    QUANTA 200

    SEM / FIBヴィンテージ: 0状態: 中古最終検証:60日以上前