説明
Magnification 1.5 Nm at 15 kV/4 Nm at 1 kV, magnification 50 - 500,000 times, cathode (cold field emission), acceleration voltage 0.5 - 30 kV, manual sample adjustment in X, Y, Z directions, BSE detector Centaurus, EDX detector Bruker X-Flash 5030, incl. accessories, consisting of: 1 PC with Bruker Esprit 2.2 software for image processing, 1 24 inch monitor, 1 signal processing unit (Bruker) .1 BSE detector control, 2 high-voltage devices, 2 oil rotary pumps, 1 Van der Heijden heat exchanger and various sample holders, tiltable by 45°構成
Scanning electron microscope with EDX detectorOEMモデルの説明
The S-4500 with a semi-in-lens type objective lens and cold field emission electron source suited to high resolution microscopy that was well received in the market.ドキュメント
ドキュメントなし
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すべて表示
HITACHI
S-4500
カテゴリ
SEM / FIB
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
127176
ウェーハサイズ：
不明
ヴィンテージ：
1993
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Magnification 1.5 Nm at 15 kV/4 Nm at 1 kV, magnification 50 - 500,000 times, cathode (cold field emission), acceleration voltage 0.5 - 30 kV, manual sample adjustment in X, Y, Z directions, BSE detector Centaurus, EDX detector Bruker X-Flash 5030, incl. accessories, consisting of: 1 PC with Bruker Esprit 2.2 software for image processing, 1 24 inch monitor, 1 signal processing unit (Bruker) .1 BSE detector control, 2 high-voltage devices, 2 oil rotary pumps, 1 Van der Heijden heat exchanger and various sample holders, tiltable by 45°構成
Scanning electron microscope with EDX detectorOEMモデルの説明
The S-4500 with a semi-in-lens type objective lens and cold field emission electron source suited to high resolution microscopy that was well received in the market.ドキュメント
ドキュメントなし