説明
REVIEW SEM構成
構成なしOEMモデルの説明
Same high performance optics as S-3400N Variable Pressure mode as standard Large samples up to 153mm in diameter (observation range 126mm in diameter) Observation and EDS analysis on a sample up to 60mm tall Main unit is only 55 cm wide, operating table can be provided by user. TMP vacuum is standard Resolution: 3.0 nm（30kV,SE,HV), 4.0 nm(30kV,BSE,LV)ドキュメント
ドキュメントなし
HITACHI
SU1510
カテゴリ
SEM / FIB
最終検証： 6日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
148247
ウェーハサイズ：
2"/50mm, 4"/100mm, 6"/150mm
ヴィンテージ：
2016
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
REVIEW SEM構成
構成なしOEMモデルの説明
Same high performance optics as S-3400N Variable Pressure mode as standard Large samples up to 153mm in diameter (observation range 126mm in diameter) Observation and EDS analysis on a sample up to 60mm tall Main unit is only 55 cm wide, operating table can be provided by user. TMP vacuum is standard Resolution: 3.0 nm（30kV,SE,HV), 4.0 nm(30kV,BSE,LV)ドキュメント
ドキュメントなし