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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS NOVA NANOSEM 600
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The Nova NanoSEM 600 is a type of high-resolution scanning electron microscope (SEM) that comes equipped with SED, BSED, and STEM detectors. It is a Dual Beam SEM/FIB system that combines the capabilities of ultra-high resolution field emission Scanning Electron Microscopy (SEM) with the precision of Focused Ion Beam (FIB) etching and deposition, making it ideal for nanoscale prototyping, machining, characterization, and analysis. When operating in STEM mode, this microscope can achieve a resolution as low as 1 nanometer. Additionally, the Nova NanoSEM 600 is capable of operating under low vacuum conditions and offers a range of analytical options including EBSD and EDS.
    ドキュメント

    ドキュメントなし

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    NOVA NANOSEM 600

    verified-listing-icon

    検証済み

    カテゴリ
    SEM

    最終検証: 30日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    112436


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS NOVA NANOSEM 600

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    NOVA NANOSEM 600

    SEM
    ヴィンテージ: 2009状態: 改修済み
    最終確認30日以上前

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    NOVA NANOSEM 600

    verified-listing-icon
    検証済み
    カテゴリ
    SEM
    最終検証: 30日以上前
    listing-photo-24b67965796646359012720794811f01-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    112436


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The Nova NanoSEM 600 is a type of high-resolution scanning electron microscope (SEM) that comes equipped with SED, BSED, and STEM detectors. It is a Dual Beam SEM/FIB system that combines the capabilities of ultra-high resolution field emission Scanning Electron Microscopy (SEM) with the precision of Focused Ion Beam (FIB) etching and deposition, making it ideal for nanoscale prototyping, machining, characterization, and analysis. When operating in STEM mode, this microscope can achieve a resolution as low as 1 nanometer. Additionally, the Nova NanoSEM 600 is capable of operating under low vacuum conditions and offers a range of analytical options including EBSD and EDS.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS NOVA NANOSEM 600

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    NOVA NANOSEM 600

    SEMヴィンテージ: 2009状態: 改修済み最終検証:30日以上前
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS NOVA NANOSEM 600

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    NOVA NANOSEM 600

    SEMヴィンテージ: 0状態: 中古最終検証:30日以上前