説明
ANALYTICAL EQUIPMENT構成
Secondary electron image resolution: 1.0nm (15kV, WD=4mm) 1.4nm (1kV, WD=1.5mm, Deceleration mode) 2.0nm (1kV, WD-1.5mm, Normal mode) Magnification: LM mode: 20 ~ 2,000X HM mode: 100 ~ 800,000X Specimen Stage: Stage Motorization: 5 axis motorized Type II: X: 0 ~ 110mm; Y: 0 ~ 110mm, Z: 1.5 ~ 40mm; T: -5 ~ +70 deg, R: 360 deg. Operating System: Windows XP Professional Options: 1. Trackball for stage control 2. TE (STEM) detector 3. Video Amplifier unit 4. Photomultiplier Power Supply 5. Deceleration function 6. Electrostatic beam blanking unit 7. Quartz PCI 8. Chamber camera 9. RS-232C 10. Dry roughing pumpOEMモデルの説明
Field Emission Scanning Electron Microscopeドキュメント
ドキュメントなし
HITACHI
S-4800 II
検証済み
カテゴリ
SEM
主なアイテムの詳細
状態:
Refurbished
稼働ステータス:
不明
製品ID:
36384
ウェーハサイズ:
8"/200mm
ヴィンテージ:
2007
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Logistics Support
Available
Money Back Guarantee
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Transaction Insured by Moov
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Refurbishment Services
Available
同様のリスト
すべて表示HITACHI
S-4800 II
検証済み
カテゴリ
SEM
最終検証: 60日以上前
主なアイテムの詳細
状態:
Refurbished
稼働ステータス:
不明
製品ID:
36384
ウェーハサイズ:
8"/200mm
ヴィンテージ:
2007
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
ANALYTICAL EQUIPMENT構成
Secondary electron image resolution: 1.0nm (15kV, WD=4mm) 1.4nm (1kV, WD=1.5mm, Deceleration mode) 2.0nm (1kV, WD-1.5mm, Normal mode) Magnification: LM mode: 20 ~ 2,000X HM mode: 100 ~ 800,000X Specimen Stage: Stage Motorization: 5 axis motorized Type II: X: 0 ~ 110mm; Y: 0 ~ 110mm, Z: 1.5 ~ 40mm; T: -5 ~ +70 deg, R: 360 deg. Operating System: Windows XP Professional Options: 1. Trackball for stage control 2. TE (STEM) detector 3. Video Amplifier unit 4. Photomultiplier Power Supply 5. Deceleration function 6. Electrostatic beam blanking unit 7. Quartz PCI 8. Chamber camera 9. RS-232C 10. Dry roughing pumpOEMモデルの説明
Field Emission Scanning Electron Microscopeドキュメント
ドキュメントなし