説明
説明なし構成
-ZEISS LEO - 1560 Scanning Electron Microscope (SEM) -Vintage 1999, bought second hand. Installed by Zeiss certified vendor. -6" stage and loadlock. 6” wafer loading thru the loadlock is possible. -Field 6” loadlock and stage. -Schottky field emission gun -In-lens SE & E-T SE detectors -Capable of 1nm resolution at 20kV -4" max wafer diameter loading with the load lock, 6'' max loading through the chamber door -Upgraded to uniplinth. Runs Smartsem v5. -Known issues: Some Flickering on image of chamberscope. -Upgraded with integrated Current monitor on stage, readable in software. -Comes with a variety of sample and wafer holders.OEMモデルの説明
提供なしドキュメント
ドキュメントなし
ZEISS / CARL ZEISS
1560
検証済み
カテゴリ
SEM
最終検証： 30日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
Installed / Idle
製品ID：
102936
ウェーハサイズ：
6"/150mm
ヴィンテージ：
1999
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ZEISS / CARL ZEISS
1560
カテゴリ
SEM
最終検証： 30日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
Installed / Idle
製品ID：
102936
ウェーハサイズ：
6"/150mm
ヴィンテージ：
1999
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
-ZEISS LEO - 1560 Scanning Electron Microscope (SEM) -Vintage 1999, bought second hand. Installed by Zeiss certified vendor. -6" stage and loadlock. 6” wafer loading thru the loadlock is possible. -Field 6” loadlock and stage. -Schottky field emission gun -In-lens SE & E-T SE detectors -Capable of 1nm resolution at 20kV -4" max wafer diameter loading with the load lock, 6'' max loading through the chamber door -Upgraded to uniplinth. Runs Smartsem v5. -Known issues: Some Flickering on image of chamberscope. -Upgraded with integrated Current monitor on stage, readable in software. -Comes with a variety of sample and wafer holders.OEMモデルの説明
提供なしドキュメント
ドキュメントなし