説明
This is a field-emission gun Transmission Electron Microscope operable up to 300kV. The high-brightness, high coherency gun allow large electron probe currents to be focused onto nanometer sized areas of the specimen. High tilt capabilities (up to 70°) allow crystallography studies. It is equipped with an Electron Energy-Loss Gatan Imaging Filter to study low-Z elements. Images can be recorded using two different CCD cameras or film in TEM. Capabilities: Field Emission Gun Twin-pole piece with point to point resolution of 0.24nm; 0.15 nm resolution can be achieved by computer processing Magnifications up to 800,000X (More than 1 million times in STEM mode) Fully computer controlled high stability CompuStage Up to 70° eucentric tilt Operation at accelerating voltages from 50kV to 300kV 4k x 4k Ultrascan CCD camera Low-noise plate camera Bright Field (BF) and Dark Field (DF) STEM imaging High Angle Annular Dark Field (HAADF) detector for Z-Contrast imaging Gatan imaging filter with 2k x 2k CCD for Electron Energy Loss Spectrometry (EELS) and Energy Filtered imaging (EFTEM) Xplore 3D and Amira software for TEM Tomography (For 3D reconstruction of TEM images) Holders: Single-tilt holder Double-tilt holder Cryo-holder Tomography holder構成
Specifications: Field Emission Gun Twin-pole piece with point to point resolution of 0.24nm; 0.15 nm resolution can be achieved by computer processing Magnifications up to 800,000X (More than 1 million times in STEM mode) Fully computer controlled high stability CompuStage Up to 70° eucentric tilt Operation at accelerating voltages from 50kV to 300kV 4k x 4k Ultrascan CCD camera Low-noise plate camera Bright Field (BF) and Dark Field (DF) STEM imaging High Angle Annular Dark Field (HAADF) detector for Z-Contrast imaging Gatan imaging filter with 2k x 2k CCD for Electron Energy Loss Spectrometry (EELS) and Energy Filtered imaging (EFTEM) Xplore 3D and Amira software for TEM Tomography (For 3D reconstruction of TEM images)OEMモデルの説明
The Tecnal"' G2 F30 series are re11able and proven (scanning) transmission electron microscopes, with a unique and unrivalled task-orie-nted user Interface. The accessories that may be fitted to these systems have largely been embedded Into this user Interface, meaning that operators can utilize the full functionality of the total microscope system through one coherent Interface, allowing all the capabilities of the system to be easily controlled by operators of different experience levels.ドキュメント
ドキュメントなし
カテゴリ
TEM
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
131555
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILIPS
TECNAI G2 F30
カテゴリ
TEM
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
131555
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
This is a field-emission gun Transmission Electron Microscope operable up to 300kV. The high-brightness, high coherency gun allow large electron probe currents to be focused onto nanometer sized areas of the specimen. High tilt capabilities (up to 70°) allow crystallography studies. It is equipped with an Electron Energy-Loss Gatan Imaging Filter to study low-Z elements. Images can be recorded using two different CCD cameras or film in TEM. Capabilities: Field Emission Gun Twin-pole piece with point to point resolution of 0.24nm; 0.15 nm resolution can be achieved by computer processing Magnifications up to 800,000X (More than 1 million times in STEM mode) Fully computer controlled high stability CompuStage Up to 70° eucentric tilt Operation at accelerating voltages from 50kV to 300kV 4k x 4k Ultrascan CCD camera Low-noise plate camera Bright Field (BF) and Dark Field (DF) STEM imaging High Angle Annular Dark Field (HAADF) detector for Z-Contrast imaging Gatan imaging filter with 2k x 2k CCD for Electron Energy Loss Spectrometry (EELS) and Energy Filtered imaging (EFTEM) Xplore 3D and Amira software for TEM Tomography (For 3D reconstruction of TEM images) Holders: Single-tilt holder Double-tilt holder Cryo-holder Tomography holder構成
Specifications: Field Emission Gun Twin-pole piece with point to point resolution of 0.24nm; 0.15 nm resolution can be achieved by computer processing Magnifications up to 800,000X (More than 1 million times in STEM mode) Fully computer controlled high stability CompuStage Up to 70° eucentric tilt Operation at accelerating voltages from 50kV to 300kV 4k x 4k Ultrascan CCD camera Low-noise plate camera Bright Field (BF) and Dark Field (DF) STEM imaging High Angle Annular Dark Field (HAADF) detector for Z-Contrast imaging Gatan imaging filter with 2k x 2k CCD for Electron Energy Loss Spectrometry (EELS) and Energy Filtered imaging (EFTEM) Xplore 3D and Amira software for TEM Tomography (For 3D reconstruction of TEM images)OEMモデルの説明
The Tecnal"' G2 F30 series are re11able and proven (scanning) transmission electron microscopes, with a unique and unrivalled task-orie-nted user Interface. The accessories that may be fitted to these systems have largely been embedded Into this user Interface, meaning that operators can utilize the full functionality of the total microscope system through one coherent Interface, allowing all the capabilities of the system to be easily controlled by operators of different experience levels.ドキュメント
ドキュメントなし