THERMOFISHER SCIENTIFIC / FEI / PHILIPS Cubed Themis G2 300

説明

The Core Instrument — FEI Titan G2 Cubed 60-300 1 Core instrument: FEI Titan G2 Cubed 60-300 High-brightness field emission gun (X-FEG) (Schottky Field Emission Gun, FEG) Electronic column (System Column) Main workstation + LCD monitor (Workstation + LCD Monitor) Control panels ×2 (Control Panels X2) 200 kV High Voltage Box Power control cabinet Bottom-Mount Digital Camera 2 Gatan 894 camera (4M) Controller and imaging software Align Genie (Alignment) 3 One free-of-charge alignment at 300 kV Scanning Transmission Electron Microscopy (STEM) Functions 4 Fischione HAADF detector and STEM scanning control module 5 TIA Imaging Software Corrector(s) 6 Image Corrector 7 Condenser Corrector Cooler/Compressor 8 Compressor 9 Cooler Vacuum System 10 Mechanical pump, molecular pump, ion pump Software and Control Systems 11 Operating system: Windows-based operating system. 12 Control software: FEI TUI software platform, used to control all electron microscope functions, including imaging, diffraction, alignment, and camera accessories. 1

構成

Model Holland — FEI Titan Cubed Themis G2 300 Accelerating Voltage 60–300 kV Brightness 8.7 × 10^7 A/m²/sr/V at 300 kV Beam Current 2 nA (0.2 nm Probe); 14 nA (1.0 nm Probe) Energy Spread 0.2 eV Pole Piece Gap 5.4 mm Condenser Lens Spherical Aberration Correction CEOS DCOR Objective Lens Spherical Aberration Correction CEOS CETCOR TEM Information Resolution (Non-linear) 0.06 nm STEM Resolution 0.06 nm CCD Camera Gatan 894 camera Pixel Size 14 µm Specimen Holder Standard double-tilt specimen holder ×1 Maximum Specimen Tilt +70° (3D reconstruction), ±40° (α) / ±30° (β) Tilt Accuracy 0.01° (Step Size) Specimen Stage Travel (X-Y) ±1 mm (motor); 1.2 µm (piezo) Specimen Stage Travel (Z) ±0.375 mm (motor) Specimen Stage Positioning Accuracy Piezo 20 pm Environmental Specimen Holder Available