説明
Aberration-Corrected TEM Main Unit: FEI Titan G2 Cubed 60-300 Double spherical aberration-corrected ultra-high resolution transmission electron microscope can observe, characterize, and quantitatively analyze the microstructure, elemental composition, and chemical valence state of materials at the subatomic scale, and conduct in-situ dynamic experiments using a specially designed sample stage Ultra-stable, high-brightness Schottky Field Emission Gun (X-FEG) Microscope Column Main Workstation + LCD Monitor Control Panels (QTY 2) 300 kV High Voltage Box Power Control Cabinet構成
Bottom Mount Digital Camera: - Gatan 894 Camera (4M) - Controller & imaging software Microscope Alignment File (One free-of-charge alignment at 300 kV) STEM: - Fischione HAADF Detector and STEM Control Cabinet (Used/Old) - TIA Imaging Software Correctors: - Objective Lens Corrector (Image Corrector) Compressor: - Air Compressor - Water Tank / Chiller (Cooler) Vacuum System: - Mechanical Pump, Molecular Pump, Ion Pump Software & Control Systems: - Windows based operating system - Control Software: FEI TUI software platform, used to control all microscope functions, lenses, alignment, cameras, and accessories.OEMモデルの説明
提供なしドキュメント
ドキュメントなし
カテゴリ
TEM
最終検証： 18日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
151783
ウェーハサイズ：
不明
ヴィンテージ：
2007
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILIPS
TITAN Cubed G2 60-300
カテゴリ
TEM
最終検証： 18日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
151783
ウェーハサイズ：
不明
ヴィンテージ：
2007
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Aberration-Corrected TEM Main Unit: FEI Titan G2 Cubed 60-300 Double spherical aberration-corrected ultra-high resolution transmission electron microscope can observe, characterize, and quantitatively analyze the microstructure, elemental composition, and chemical valence state of materials at the subatomic scale, and conduct in-situ dynamic experiments using a specially designed sample stage Ultra-stable, high-brightness Schottky Field Emission Gun (X-FEG) Microscope Column Main Workstation + LCD Monitor Control Panels (QTY 2) 300 kV High Voltage Box Power Control Cabinet構成
Bottom Mount Digital Camera: - Gatan 894 Camera (4M) - Controller & imaging software Microscope Alignment File (One free-of-charge alignment at 300 kV) STEM: - Fischione HAADF Detector and STEM Control Cabinet (Used/Old) - TIA Imaging Software Correctors: - Objective Lens Corrector (Image Corrector) Compressor: - Air Compressor - Water Tank / Chiller (Cooler) Vacuum System: - Mechanical Pump, Molecular Pump, Ion Pump Software & Control Systems: - Windows based operating system - Control Software: FEI TUI software platform, used to control all microscope functions, lenses, alignment, cameras, and accessories.OEMモデルの説明
提供なしドキュメント
ドキュメントなし