説明
1 Mainframe (The Core Instrument): Aberration-corrected TEM Mainframe: FEI Titan G2 Cubed 60-300 • Ultra-stable, high-brightness Schottky Field Emission Gun (X-FEG) • Electron Optical System Column • Workstation Computer + LCD Monitor • Dual Control Panels (Control Panels ×2) • 300 kV High Voltage Box • Power Distribution Control Cabinet 2 Bottom-Mount Digital Camera: Gatan 894 Camera (4M / 2k×2k CCD) • Dedicated camera controller and digital acquisition software 3 Align Genie (Beam Alignment): Microscope Alignment Files (One complimentary alignment calibration at 300 kV) 4 STEM Function: Fischione HAADF (High-Angle Annular Dark-Field) Detector & STEM Control Cabinet (Pre-owned / Refurbished) 5 STEM Function: TIA (TEM Imaging & Analysis) Software Package 6 Corrector(s): Objective Lens Corrector (Image Corrector) 7 Cooler / Compressor: Air Compressor 8 Cooler / Compressor: Water Chiller / Cooler Unit (Water Tank) 9 Vacuum System: Vacuum Pumping Suite: Mechanical Pump, Turbomolecular Pump, and Ion Getter Pump 10 Software and Control Systems: Operating System: Microsoft Windows-based Operating System 11 Software and Control Systems: Instrument Control Software: FEI TUI software platform for comprehensive control of microscope functions, lenses, beam alignments, cameras, and auxiliary accessories構成
# Parameter Name Specification Value 1 Electron Gun Ultra-high Brightness Schottky Thermal Field Emission Gun (X-FEG) 2 Probe / Beam Current 2 nA (at 0.2 nm probe); 14 nA (at 1.0 nm probe) 3 Source Brightness 8.7 × 10⁷ A/(m²·sr) @ 300 kV 4 Accelerating Voltage 60 – 300 kV (Continuously adjustable / steps) 5 Objective Spherical Aberration Corrector CEOS CETCOR (Image Corrector) 6 Probe Spherical Aberration Corrector CEOS CETCOR (Probe Corrector) 7 TEM Information Limit (Resolution) 0.06 nm (0.6 Å) [Non-linear] 8 STEM Resolution 0.06 nm (0.6 Å) 9 CCD Camera Gatan 894 (UltraScan 1000 2k×2k / 4M CCD) 10 Pixel Size 14 µm 11 Energy Spread 0.2 eV 12 Pole Piece Gap 5.4 mm 13 Specimen Holder Standard Double-Tilt Sample Holder (×1 included) 14 Tilt Angle Precision 0.01° (Step Size) 15 Maximum Specimen Tilt ±70° (3D Tomography Reconstruction); ±40° (α) / +30° (β) 16 Stage Travel Range (X-Y) 1 mm (Motorized) / 1.2 µm (Piezo fine range) 17 Stage Travel Range (Z) ±0.375 mm (Motorized) 18 Stage Positioning Resolution 20 pm (0.02 nm) via Piezoelectric drive 19 Environmental / In-situ Holders Compatible / SupportedOEMモデルの説明
An advanced, aberration-corrected scanning/transmission electron microscope (S/TEM) designed for ultra-high-resolution atomic-scale imaging and chemical analysisドキュメント
ドキュメントなし
カテゴリ
TEM
最終検証： 18日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
152159
ウェーハサイズ：
不明
ヴィンテージ：
2007
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILIPS
Titan Cubed G2
カテゴリ
TEM
最終検証： 18日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
152159
ウェーハサイズ：
不明
ヴィンテージ：
2007
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
1 Mainframe (The Core Instrument): Aberration-corrected TEM Mainframe: FEI Titan G2 Cubed 60-300 • Ultra-stable, high-brightness Schottky Field Emission Gun (X-FEG) • Electron Optical System Column • Workstation Computer + LCD Monitor • Dual Control Panels (Control Panels ×2) • 300 kV High Voltage Box • Power Distribution Control Cabinet 2 Bottom-Mount Digital Camera: Gatan 894 Camera (4M / 2k×2k CCD) • Dedicated camera controller and digital acquisition software 3 Align Genie (Beam Alignment): Microscope Alignment Files (One complimentary alignment calibration at 300 kV) 4 STEM Function: Fischione HAADF (High-Angle Annular Dark-Field) Detector & STEM Control Cabinet (Pre-owned / Refurbished) 5 STEM Function: TIA (TEM Imaging & Analysis) Software Package 6 Corrector(s): Objective Lens Corrector (Image Corrector) 7 Cooler / Compressor: Air Compressor 8 Cooler / Compressor: Water Chiller / Cooler Unit (Water Tank) 9 Vacuum System: Vacuum Pumping Suite: Mechanical Pump, Turbomolecular Pump, and Ion Getter Pump 10 Software and Control Systems: Operating System: Microsoft Windows-based Operating System 11 Software and Control Systems: Instrument Control Software: FEI TUI software platform for comprehensive control of microscope functions, lenses, beam alignments, cameras, and auxiliary accessories構成
# Parameter Name Specification Value 1 Electron Gun Ultra-high Brightness Schottky Thermal Field Emission Gun (X-FEG) 2 Probe / Beam Current 2 nA (at 0.2 nm probe); 14 nA (at 1.0 nm probe) 3 Source Brightness 8.7 × 10⁷ A/(m²·sr) @ 300 kV 4 Accelerating Voltage 60 – 300 kV (Continuously adjustable / steps) 5 Objective Spherical Aberration Corrector CEOS CETCOR (Image Corrector) 6 Probe Spherical Aberration Corrector CEOS CETCOR (Probe Corrector) 7 TEM Information Limit (Resolution) 0.06 nm (0.6 Å) [Non-linear] 8 STEM Resolution 0.06 nm (0.6 Å) 9 CCD Camera Gatan 894 (UltraScan 1000 2k×2k / 4M CCD) 10 Pixel Size 14 µm 11 Energy Spread 0.2 eV 12 Pole Piece Gap 5.4 mm 13 Specimen Holder Standard Double-Tilt Sample Holder (×1 included) 14 Tilt Angle Precision 0.01° (Step Size) 15 Maximum Specimen Tilt ±70° (3D Tomography Reconstruction); ±40° (α) / +30° (β) 16 Stage Travel Range (X-Y) 1 mm (Motorized) / 1.2 µm (Piezo fine range) 17 Stage Travel Range (Z) ±0.375 mm (Motorized) 18 Stage Positioning Resolution 20 pm (0.02 nm) via Piezoelectric drive 19 Environmental / In-situ Holders Compatible / SupportedOEMモデルの説明
An advanced, aberration-corrected scanning/transmission electron microscope (S/TEM) designed for ultra-high-resolution atomic-scale imaging and chemical analysisドキュメント
ドキュメントなし