説明
A 300kV field emission transmission electron microscope (FET) renowned for its outstanding high-resolution imaging and analytical capabilities. Equipped with a STEM mode, it can perform nanoscale compositional and structural analysis TEM Electron diffraction and diffraction contrast analysis High-resolution transmission electron microscopy (HRTEM) Scanning transmission electron microscopy (STEM) Energy-dispersive X-ray spectroscopy (EDS) analysis Electron energy loss spectroscopy (EELS) and energy-filtered TEM (EFTEM) techniques 3D Tomography Description Core Instrument: FEI Titan G2 Cubed 60-300 1 • Transmission Electron Microscope Main Unit: FEI Tecnai F30 • Schottky Field Emission Gun (FEG) • Workstation + LCD Monitor • Electron Gun & Column (System Column) • Control Panels (2 units) • 300 kV High-Voltage Tank (listed as 200 kV High Voltage Box in original text) • Power Control Cabinet 1 Bottom-Mount Digital Camera 2 Gatan 894 Camera (4M) 1 Controller and Imaging Software 1 Align Genie (Beam Alignment) 3 Microscope Alignment Files (One free-of-charge alignment at 300 kV) 1 Scanning Transmission (STEM) Mode 4 Fischione HAADF Detector & STEM Control Cabinet 1 5 TIA Imaging Software 1 Cooler / Compressor 6 Air Compressor 1 7 Water Chiller / Tank 1 Vacuum System 8 Mechanical Pump, Turbo Molecular Pump, Ion Getter Pump 1 Software and Control Systems 9 Operating System: Windows-based OS 1 10 Control Software: FEI TUI Software Platform (controls all microscope functions, lenses, alignments, cameras, and attachments)構成
Main Technical Specifications Electron Source: Schottky Field Emission Gun (FEG) Point Resolution: $0.205\text{ nm}$ Line Resolution: $0.102\text{ nm}$ Information Limit: $0.14\text{ nm}$ STEM-HAADF Mode Resolution: $0.17\text{ nm}$ Chromatic Aberration Coefficient ($C_c$): $1.4\text{ mm}$ Spherical Aberration Coefficient ($C_s$): $1.2\text{ mm}$ Microscope Simulation Parameters: Accelerating Voltage: $300\text{ kV}$ Chromatic Aberration ($C_c$): $1.4\text{ mm}$ Spherical Aberration ($C_s$): $1.2\text{ mm}$ Energy Spread ($\Delta E$): $0.8\text{ eV}$ Convergence Semi-Angle ($\alpha$): $0.2\text{ mrad}$OEMモデルの説明
提供なしドキュメント
ドキュメントなし
カテゴリ
TEM
最終検証： 18日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
151800
ウェーハサイズ：
不明
ヴィンテージ：
2010
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILIPS
F30
カテゴリ
TEM
最終検証： 18日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
151800
ウェーハサイズ：
不明
ヴィンテージ：
2010
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
A 300kV field emission transmission electron microscope (FET) renowned for its outstanding high-resolution imaging and analytical capabilities. Equipped with a STEM mode, it can perform nanoscale compositional and structural analysis TEM Electron diffraction and diffraction contrast analysis High-resolution transmission electron microscopy (HRTEM) Scanning transmission electron microscopy (STEM) Energy-dispersive X-ray spectroscopy (EDS) analysis Electron energy loss spectroscopy (EELS) and energy-filtered TEM (EFTEM) techniques 3D Tomography Description Core Instrument: FEI Titan G2 Cubed 60-300 1 • Transmission Electron Microscope Main Unit: FEI Tecnai F30 • Schottky Field Emission Gun (FEG) • Workstation + LCD Monitor • Electron Gun & Column (System Column) • Control Panels (2 units) • 300 kV High-Voltage Tank (listed as 200 kV High Voltage Box in original text) • Power Control Cabinet 1 Bottom-Mount Digital Camera 2 Gatan 894 Camera (4M) 1 Controller and Imaging Software 1 Align Genie (Beam Alignment) 3 Microscope Alignment Files (One free-of-charge alignment at 300 kV) 1 Scanning Transmission (STEM) Mode 4 Fischione HAADF Detector & STEM Control Cabinet 1 5 TIA Imaging Software 1 Cooler / Compressor 6 Air Compressor 1 7 Water Chiller / Tank 1 Vacuum System 8 Mechanical Pump, Turbo Molecular Pump, Ion Getter Pump 1 Software and Control Systems 9 Operating System: Windows-based OS 1 10 Control Software: FEI TUI Software Platform (controls all microscope functions, lenses, alignments, cameras, and attachments)構成
Main Technical Specifications Electron Source: Schottky Field Emission Gun (FEG) Point Resolution: $0.205\text{ nm}$ Line Resolution: $0.102\text{ nm}$ Information Limit: $0.14\text{ nm}$ STEM-HAADF Mode Resolution: $0.17\text{ nm}$ Chromatic Aberration Coefficient ($C_c$): $1.4\text{ mm}$ Spherical Aberration Coefficient ($C_s$): $1.2\text{ mm}$ Microscope Simulation Parameters: Accelerating Voltage: $300\text{ kV}$ Chromatic Aberration ($C_c$): $1.4\text{ mm}$ Spherical Aberration ($C_s$): $1.2\text{ mm}$ Energy Spread ($\Delta E$): $0.8\text{ eV}$ Convergence Semi-Angle ($\alpha$): $0.2\text{ mrad}$OEMモデルの説明
提供なしドキュメント
ドキュメントなし