説明
A transmission electron microscope (TEM) with an operating voltage range of 20 to 120 kV. Capabilities include magnifications of thin samples (<200 nm) up to 700,000 times, an energy-dispersive X-ray spectroscopy (EDS) system, a Gatan MSC794 CCD camera for digital image acquisition, and a video camera for video-rate recording at moderate magnifications. The Tecnai T12 microscope combines all imaging, diffraction, and analytical techniques at good spatial resolution and detection efficiency. A variety of heating, cooling, and mechanical testing sample holders are available for use with this microscope. Application-Specific Modes Bright- and dark-field imaging. TEM microprobe and nanoprobe analysis. Small-probe convergent beam. Large specimen tilt. Accessories: Specimen Holders - Single-tilt, double-tilt, and tilt–rotate holders. Double-tilt cooling. Single- and double-tilt heating. Straining and indenting holders. Low-background single-tilt EDX holder. Energy Dispersive X-ray Spectrometer - An Oxford Inca system with an ultrathin window Si(Li) detector can detect characteristic X-rays generated by elements from beryllium to uranium. Software allows for the analysis of signals, digital background subtraction, and automatic peak identification. Specifications: The Tecnai T12 microscope combines all imaging, diffraction, and analytical techniques at good spatial resolution and detection efficiency. Application-specific modes include: Bright- and dark-field imaging; TEM microprobe and nanoprobe analysis; small-probe convergent beam; and large specimen tilts. LaB6 source. Accelerating voltage range of 20 to 120 kV. Magnifications up to 700,000x. Point resolution: 0.34 nm; Line resolution: 0.2 nm. Maximum specimen tilt: 70�. Drift rate: <1 nm / min. Specimen holders: Single tilt; double tilt; tilt–rotate; double-tilt cooling; single- and double-tilt heating; low-background single-tilt EDX; and straining/indenting mechanical holders. Energy-dispersive X-ray spectrometer: Oxford Inca system with an ultrathin window allows the detection of elements from beryllium to uranium. Sample applications include: Composition analysis structure of grain boundaries in ceramics. Magnetic films on chromium. Identification of precipitates in materials. Analysis of nanoparticle sizes. Capabilities: Sample size: 3 nm discs < 1 mm thick Point resolution: 0.34 nm Line resolution: 0.2 nm Maximum specimen tilt: 70° Drift rate: <1 nm / min構成
構成なしOEMモデルの説明
提供なしドキュメント
ドキュメントなし
カテゴリ
TEM
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
131556
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILIPS
Tecnai G2 T12
カテゴリ
TEM
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
131556
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
A transmission electron microscope (TEM) with an operating voltage range of 20 to 120 kV. Capabilities include magnifications of thin samples (<200 nm) up to 700,000 times, an energy-dispersive X-ray spectroscopy (EDS) system, a Gatan MSC794 CCD camera for digital image acquisition, and a video camera for video-rate recording at moderate magnifications. The Tecnai T12 microscope combines all imaging, diffraction, and analytical techniques at good spatial resolution and detection efficiency. A variety of heating, cooling, and mechanical testing sample holders are available for use with this microscope. Application-Specific Modes Bright- and dark-field imaging. TEM microprobe and nanoprobe analysis. Small-probe convergent beam. Large specimen tilt. Accessories: Specimen Holders - Single-tilt, double-tilt, and tilt–rotate holders. Double-tilt cooling. Single- and double-tilt heating. Straining and indenting holders. Low-background single-tilt EDX holder. Energy Dispersive X-ray Spectrometer - An Oxford Inca system with an ultrathin window Si(Li) detector can detect characteristic X-rays generated by elements from beryllium to uranium. Software allows for the analysis of signals, digital background subtraction, and automatic peak identification. Specifications: The Tecnai T12 microscope combines all imaging, diffraction, and analytical techniques at good spatial resolution and detection efficiency. Application-specific modes include: Bright- and dark-field imaging; TEM microprobe and nanoprobe analysis; small-probe convergent beam; and large specimen tilts. LaB6 source. Accelerating voltage range of 20 to 120 kV. Magnifications up to 700,000x. Point resolution: 0.34 nm; Line resolution: 0.2 nm. Maximum specimen tilt: 70�. Drift rate: <1 nm / min. Specimen holders: Single tilt; double tilt; tilt–rotate; double-tilt cooling; single- and double-tilt heating; low-background single-tilt EDX; and straining/indenting mechanical holders. Energy-dispersive X-ray spectrometer: Oxford Inca system with an ultrathin window allows the detection of elements from beryllium to uranium. Sample applications include: Composition analysis structure of grain boundaries in ceramics. Magnetic films on chromium. Identification of precipitates in materials. Analysis of nanoparticle sizes. Capabilities: Sample size: 3 nm discs < 1 mm thick Point resolution: 0.34 nm Line resolution: 0.2 nm Maximum specimen tilt: 70° Drift rate: <1 nm / min構成
構成なしOEMモデルの説明
提供なしドキュメント
ドキュメントなし