説明
Aberration-Corrected TEM Main Unit: FEI Titan G2 Cubed 60-300 Main Workstation + Display Control Panels x2 300 kV High Voltage Box Power Control Cabinet Bottom-Mount Digital Camera: - Gatan 894 Camera (4M) - Controller and Imaging Software Align Genie: - Microscope Alignment File (One free-of-charge alignment at 300 kV) Fischione HAADF Detector and STEM Control Cabinet TIA Imaging Software Objective Lens Corrector (Image Corrector) Condenser Lens Corrector (Condenser Corrector) Air Compressor Water Tank / Chiller (Cooler) Mechanical Pump, Molecular Pump, Ion Pump Windows Operating System Control Software: FEI TUI software platform, used to control all microscope functions, lenses, alignment, cameras, and accessories構成
Accelerating Voltage: 60–300 kV Brightness: $8.7 \times 10^7\text{ A/m}^2/\text{sr/V}$ *@300 kV Probe Current: 2 nA (0.2 nm Probe) / 14 nA (1.0 nm Probe) Energy Spread: 0.2 eV Pole Piece Gap: 5.4 mm Condenser Spherical Aberration Corrector: CEOS DCOR Objective Spherical Aberration Corrector: CEOS CETCOR TEM Information Limit / Resolution (Non-linear): 0.06 nm STEM Resolution: 0.06 nm CCD Camera: Gatan 894 Camera Pixel Size: 14 µm Sample Holder: Standard Double-Tilt Sample Holder x1 Maximum Sample Tilt Angle: +70° (3D Reconstruction) / ±40° (α) / ±30° (β) Tilt Precision: 0.01° (Step Size) Sample Stage Movement Range (X-Y): ±1 mm (motor) / 1.2 µm (piezo) Sample Stage Movement Range (Z): ±0.375 mm (motor) Sample Stage Displacement Precision: Piezo 20 pm Environmental Sample Holder: Available Ultra-stable, high-brightness Schottky Field Emission Gun (X-FEG)OEMモデルの説明
The image-corrected Titan G2 60-300 S/TEM provides superior performance, stability, and flexibility when utilizing the Cs image-corrector and electron monochromator technology for atomic resolution imaging and spectroscopy. The system provides flexibility of operating voltages at 60, 160 and 300 kV. Additionally, with the relatively wide pole piece gap of the S-TWIN lens, the Titan G2 60-300 is designed for dynamic experiments, with space around the sample area.ドキュメント
ドキュメントなし
カテゴリ
TEM
最終検証： 18日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
151781
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILIPS
TITAN G2 60-300
カテゴリ
TEM
最終検証： 18日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
151781
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Aberration-Corrected TEM Main Unit: FEI Titan G2 Cubed 60-300 Main Workstation + Display Control Panels x2 300 kV High Voltage Box Power Control Cabinet Bottom-Mount Digital Camera: - Gatan 894 Camera (4M) - Controller and Imaging Software Align Genie: - Microscope Alignment File (One free-of-charge alignment at 300 kV) Fischione HAADF Detector and STEM Control Cabinet TIA Imaging Software Objective Lens Corrector (Image Corrector) Condenser Lens Corrector (Condenser Corrector) Air Compressor Water Tank / Chiller (Cooler) Mechanical Pump, Molecular Pump, Ion Pump Windows Operating System Control Software: FEI TUI software platform, used to control all microscope functions, lenses, alignment, cameras, and accessories構成
Accelerating Voltage: 60–300 kV Brightness: $8.7 \times 10^7\text{ A/m}^2/\text{sr/V}$ *@300 kV Probe Current: 2 nA (0.2 nm Probe) / 14 nA (1.0 nm Probe) Energy Spread: 0.2 eV Pole Piece Gap: 5.4 mm Condenser Spherical Aberration Corrector: CEOS DCOR Objective Spherical Aberration Corrector: CEOS CETCOR TEM Information Limit / Resolution (Non-linear): 0.06 nm STEM Resolution: 0.06 nm CCD Camera: Gatan 894 Camera Pixel Size: 14 µm Sample Holder: Standard Double-Tilt Sample Holder x1 Maximum Sample Tilt Angle: +70° (3D Reconstruction) / ±40° (α) / ±30° (β) Tilt Precision: 0.01° (Step Size) Sample Stage Movement Range (X-Y): ±1 mm (motor) / 1.2 µm (piezo) Sample Stage Movement Range (Z): ±0.375 mm (motor) Sample Stage Displacement Precision: Piezo 20 pm Environmental Sample Holder: Available Ultra-stable, high-brightness Schottky Field Emission Gun (X-FEG)OEMモデルの説明
The image-corrected Titan G2 60-300 S/TEM provides superior performance, stability, and flexibility when utilizing the Cs image-corrector and electron monochromator technology for atomic resolution imaging and spectroscopy. The system provides flexibility of operating voltages at 60, 160 and 300 kV. Additionally, with the relatively wide pole piece gap of the S-TWIN lens, the Titan G2 60-300 is designed for dynamic experiments, with space around the sample area.ドキュメント
ドキュメントなし