TECNAI

FEI Tecnai G2 F20 FEG

** MAIN FEATURES **

** BEAM **
FEG electron source Schottky thermal field emitter
Beam voltage 80 to 200 kV

** RESOLUTION **
DEPENDING ON AMBIENT CONDITIONS OF THE SITE
Point resolution 0.27 nm
Line resolution 0.144 nm
Information Limit 0.18 nm

** DETECTORS **
None

** STAGE **
X and Y range 2 mm
Z range 750 µm
α tilt range -80 to +80°

** ACCESSORIES **
None

User interface Windows XP® GUI
Scripting allowing remote control

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Super Twin with 4K camera

The FEI Tecnai F20 transmission electron microscope is a 200kV field emitter model equipped with a 4K imaging system. It can observe nanoscale morphology and atomic lattice, analyze crystalline phases and micro-area elemental composition, and is used for microscopic detection and failure analysis of new materials, semiconductors, metals, and biological samples.

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PHILIPS Tecnai F20 Ultra twin

MAIN FEATURES

RESOLUTION

DETECTORS

STAGE

ACCESSORIES

Gatan camera is out of order
simple and double tilt sample holders.

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The FEI Tecnai G2 F20 is a 200 kV field emission transmission and scanning transmission electron microscope (S/TEM) designed for high-performance TEM and STEM imaging as well as nanoanalysis. It allows simultaneous data acquisition through fully embedded detectors and cameras. Applications include materials science, nanotechnology, and tomography.

** BEAM **
– Schottky field emitter
– Accelerating voltage range: 20–200 kV

** RESOLUTION **
– TEM point resolution: 0.24 nm (S-TWIN lens)
– TEM line resolution: 0.102 nm
– STEM HAADF resolution: 0.19 nm

** DETECTORS **
– GIF: Gatan Tridiem ER energy filter
– EDX: EDAX TEC 30T/30ST, 165-5, 30 mm²
– Camera: Gatan US1000
– Gatan STEM interface

** STAGE **
– Standard eucentric CompuStage, tomography optimized
– X, Y movement ±1 mm, Z ±0.375 mm
– Tilt range up to ±80° (with tomography holder)

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F20

カテゴリ

概要（Overview）

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