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TECNAI F20
    説明
    The FEI Tecnai G2 F20 is a 200 kV field emission transmission and scanning transmission electron microscope (S/TEM) designed for high-performance TEM and STEM imaging as well as nanoanalysis. It allows simultaneous data acquisition through fully embedded detectors and cameras. Applications include materials science, nanotechnology, and tomography. ** BEAM ** – Schottky field emitter – Accelerating voltage range: 20–200 kV ** RESOLUTION ** – TEM point resolution: 0.24 nm (S-TWIN lens) – TEM line resolution: 0.102 nm – STEM HAADF resolution: 0.19 nm ** DETECTORS ** – GIF: Gatan Tridiem ER energy filter – EDX: EDAX TEC 30T/30ST, 165-5, 30 mm² – Camera: Gatan US1000 – Gatan STEM interface ** STAGE ** – Standard eucentric CompuStage, tomography optimized – X, Y movement ±1 mm, Z ±0.375 mm – Tilt range up to ±80° (with tomography holder)
    構成
    構成なし
    OEMモデルの説明
    提供なし
    ドキュメント

    ドキュメントなし

    verified-listing-icon

    検証済み

    カテゴリ
    TEM

    最終検証: 12日前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    147193


    ウェーハサイズ:

    不明


    ヴィンテージ:

    2005


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    TECNAI F20

    TECNAI

    F20

    TEM
    ヴィンテージ: 2003状態: 中古
    最終確認12日前

    TECNAI

    F20

    verified-listing-icon
    検証済み
    カテゴリ
    TEM
    最終検証: 12日前
    listing-photo-68e9f882249a4a5abf6cf13f2f911727-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/88388/68e9f882249a4a5abf6cf13f2f911727/9950cd8c56184433884bbc6e7f5b619e_8b0b358cbd5f4b388330580f4d924a55_mw.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    147193


    ウェーハサイズ:

    不明


    ヴィンテージ:

    2005


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    The FEI Tecnai G2 F20 is a 200 kV field emission transmission and scanning transmission electron microscope (S/TEM) designed for high-performance TEM and STEM imaging as well as nanoanalysis. It allows simultaneous data acquisition through fully embedded detectors and cameras. Applications include materials science, nanotechnology, and tomography. ** BEAM ** – Schottky field emitter – Accelerating voltage range: 20–200 kV ** RESOLUTION ** – TEM point resolution: 0.24 nm (S-TWIN lens) – TEM line resolution: 0.102 nm – STEM HAADF resolution: 0.19 nm ** DETECTORS ** – GIF: Gatan Tridiem ER energy filter – EDX: EDAX TEC 30T/30ST, 165-5, 30 mm² – Camera: Gatan US1000 – Gatan STEM interface ** STAGE ** – Standard eucentric CompuStage, tomography optimized – X, Y movement ±1 mm, Z ±0.375 mm – Tilt range up to ±80° (with tomography holder)
    構成
    構成なし
    OEMモデルの説明
    提供なし
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    TECNAI F20

    TECNAI

    F20

    TEMヴィンテージ: 2003状態: 中古最終検証:12日前
    TECNAI F20

    TECNAI

    F20

    TEMヴィンテージ: 2012状態: 中古最終検証:12日前
    TECNAI F20

    TECNAI

    F20

    TEMヴィンテージ: 2002状態: 中古最終検証:12日前