説明
FEI Tecnai G2 F30 TWIN 300kV FEG TEM構成
– FEI Tecnai G2 F30 TWIN 300 kV FEG Transmission Electron Microscope – Suitable for materials science, nanomaterials, and life sciences ** BEAM ** – Field emission gun (FEG) – Acceleration voltage: 300 kV ** RESOLUTION ** – Point resolution: 0.24 nm – Line resolution: 0.14 nm ** DETECTORS ** – Gatan UltraScan 4000 UHS MP (multi-port readout) for 300 kV ** STAGE ** – Single-tilt holder – Single-tilt tomography holder – Double-tilt holder – Five-axis motorized goniometer stage – Typical tilt range up to ±70 degrees with tomography holderOEMモデルの説明
提供なしドキュメント
ドキュメントなし
TECNAI
F20
カテゴリ
TEM
最終検証： 12日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
147194
ウェーハサイズ：
不明
ヴィンテージ：
2002
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
FEI Tecnai G2 F30 TWIN 300kV FEG TEM構成
– FEI Tecnai G2 F30 TWIN 300 kV FEG Transmission Electron Microscope – Suitable for materials science, nanomaterials, and life sciences ** BEAM ** – Field emission gun (FEG) – Acceleration voltage: 300 kV ** RESOLUTION ** – Point resolution: 0.24 nm – Line resolution: 0.14 nm ** DETECTORS ** – Gatan UltraScan 4000 UHS MP (multi-port readout) for 300 kV ** STAGE ** – Single-tilt holder – Single-tilt tomography holder – Double-tilt holder – Five-axis motorized goniometer stage – Typical tilt range up to ±70 degrees with tomography holderOEMモデルの説明
提供なしドキュメント
ドキュメントなし