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ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 8000
    説明
    説明なし
    構成
    Film Thickness Measurement System
    OEMモデルの説明
    The NanoSpec 8000 is a fully automated film thickness measurement system introduced by Nanometrics. It is designed to meet the speed, measurement, performance, and reliability requirements essential to high-level factory control in today’s semiconductor mega-fabs and magnetic head production. The system can be programmed to run operator-free and offers a wide range of film thickness measurements for 75 mm to 200 mm wafers. Additionally, it boasts a low cost of ownership.
    ドキュメント

    ドキュメントなし

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 8000

    verified-listing-icon

    検証済み

    カテゴリ
    Thin Film / Film Thickness

    最終検証: 30日前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    117081


    ウェーハサイズ:

    不明


    ヴィンテージ:

    1996


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 8000

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 8000

    Thin Film / Film Thickness
    ヴィンテージ: 1996状態: 中古
    最終確認30日前

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 8000

    verified-listing-icon
    検証済み
    カテゴリ
    Thin Film / Film Thickness
    最終検証: 30日前
    listing-photo-b3e240a9aca44328bda7a8b3668d6ab8-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    117081


    ウェーハサイズ:

    不明


    ヴィンテージ:

    1996


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    説明なし
    構成
    Film Thickness Measurement System
    OEMモデルの説明
    The NanoSpec 8000 is a fully automated film thickness measurement system introduced by Nanometrics. It is designed to meet the speed, measurement, performance, and reliability requirements essential to high-level factory control in today’s semiconductor mega-fabs and magnetic head production. The system can be programmed to run operator-free and offers a wide range of film thickness measurements for 75 mm to 200 mm wafers. Additionally, it boasts a low cost of ownership.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 8000

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 8000

    Thin Film / Film Thicknessヴィンテージ: 1996状態: 中古最終検証:30日前
    ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 8000

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 8000

    Thin Film / Film Thicknessヴィンテージ: 2000状態: 中古最終検証:30日以上前
    ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 8000

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 8000

    Thin Film / Film Thicknessヴィンテージ: 1996状態: 中古最終検証:30日以上前