メインコンテンツにスキップ
6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
Moov logo

6" Fab For Sale from Moov - Click Here to Learn More
Moov Icon
KLA UV-1280SE
    説明
    FILM THICKNESS MEASUREMENT
    構成
    構成なし
    OEMモデルの説明
    The Prometrix UV-1280SE is a production thin film measurement system that combines dual-beam spectrophotometry and broadband spectroscopic ellipsometry. It can directly measure film thickness, refractive index, and extinction coefficient of single- and multi-layer thin film stacks simultaneously. The system is easy to use, lowers cost of ownership, and increases production efficiency. It is useful for both process control and advanced materials development.
    ドキュメント

    ドキュメントなし

    KLA

    UV-1280SE

    verified-listing-icon

    検証済み

    カテゴリ
    Thin Film / Film Thickness

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    78325


    ウェーハサイズ:

    8"/200mm


    ヴィンテージ:

    2003


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    KLA UV-1280SE

    KLA

    UV-1280SE

    Thin Film / Film Thickness
    ヴィンテージ: 2000状態: 中古
    最終確認60日以上前

    KLA

    UV-1280SE

    verified-listing-icon
    検証済み
    カテゴリ
    Thin Film / Film Thickness
    最終検証: 60日以上前
    listing-photo-95de351d15fd48baae961fc817937efa-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    78325


    ウェーハサイズ:

    8"/200mm


    ヴィンテージ:

    2003


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    FILM THICKNESS MEASUREMENT
    構成
    構成なし
    OEMモデルの説明
    The Prometrix UV-1280SE is a production thin film measurement system that combines dual-beam spectrophotometry and broadband spectroscopic ellipsometry. It can directly measure film thickness, refractive index, and extinction coefficient of single- and multi-layer thin film stacks simultaneously. The system is easy to use, lowers cost of ownership, and increases production efficiency. It is useful for both process control and advanced materials development.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    KLA UV-1280SE

    KLA

    UV-1280SE

    Thin Film / Film Thicknessヴィンテージ: 2000状態: 中古最終検証:60日以上前
    KLA UV-1280SE

    KLA

    UV-1280SE

    Thin Film / Film Thicknessヴィンテージ: 0状態: 中古最終検証:60日以上前
    KLA UV-1280SE

    KLA

    UV-1280SE

    Thin Film / Film Thicknessヴィンテージ: 0状態: 中古最終検証:23日前