説明
Asset Description: BRUKER D8 FABLINE XRAY DEFRACTION Software Version: na CIM: SECS GEM Process: Profilometer X Ray Defraction構成
Hardware Configuration System Type Description Quantity Main System Stage with X ray 1 Others Handler System Robot 1 Factory Interface FOUP 2 Options SystemOEMモデルの説明
The D8 FABLINE provides fully automated handling of 300mm wafers . It provides a wide spectrum of techniques, such as rapid X-ray reflectivity (XRR), grazing incidence X-ray diffraction (GID), and high-resolution X-ray diffraction (HR-XRD) in order to facilitate advanced process development and control on strained devices and high-K thin films, as well as materials characterization for future generation technology nodes.ドキュメント
ドキュメントなし
検証済み
カテゴリ
X-Ray / XRD / XRF
最終検証： 29日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
136267
ウェーハサイズ：
12"/300mm
ヴィンテージ：
2014
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
BRUKER
D8 FABLINE
カテゴリ
X-Ray / XRD / XRF
最終検証： 29日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
136267
ウェーハサイズ：
12"/300mm
ヴィンテージ：
2014
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Asset Description: BRUKER D8 FABLINE XRAY DEFRACTION Software Version: na CIM: SECS GEM Process: Profilometer X Ray Defraction構成
Hardware Configuration System Type Description Quantity Main System Stage with X ray 1 Others Handler System Robot 1 Factory Interface FOUP 2 Options SystemOEMモデルの説明
The D8 FABLINE provides fully automated handling of 300mm wafers . It provides a wide spectrum of techniques, such as rapid X-ray reflectivity (XRR), grazing incidence X-ray diffraction (GID), and high-resolution X-ray diffraction (HR-XRD) in order to facilitate advanced process development and control on strained devices and high-K thin films, as well as materials characterization for future generation technology nodes.ドキュメント
ドキュメントなし