説明
説明なし構成
-Configured for 8 inch (6" wafer sizes possible) -SW Version: 11 Options list: SECS Multipoint Measurement Hole Measurement Reduced Scan Image Database CP Controller Save to DOS FD IP Read Operator AccessoriesOEMモデルの説明
S-7840 review SEM has been incorporated with (1) ADR (automatic defect review) and ADC (automatic defect classification), (2) data interface with various inspection equipment, (3) an interface which transfers review results with SEM images showing the defects to an advanced data analysis system, and (4) defect sampling function which allows selection of type of defects for reviewing.ドキュメント
ドキュメントなし
HITACHI
S-7840
検証済み
カテゴリ
CD-SEM
最終検証： 60日以上前
主なアイテムの詳細
状態：
Refurbished
稼働ステータス:
不明
製品ID：
54796
ウェーハサイズ：
8"/200mm
ヴィンテージ：
2001
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
HITACHI
S-7840
カテゴリ
CD-SEM
最終検証： 60日以上前
主なアイテムの詳細
状態：
Refurbished
稼働ステータス:
不明
製品ID：
54796
ウェーハサイズ：
8"/200mm
ヴィンテージ：
2001
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
-Configured for 8 inch (6" wafer sizes possible) -SW Version: 11 Options list: SECS Multipoint Measurement Hole Measurement Reduced Scan Image Database CP Controller Save to DOS FD IP Read Operator AccessoriesOEMモデルの説明
S-7840 review SEM has been incorporated with (1) ADR (automatic defect review) and ADC (automatic defect classification), (2) data interface with various inspection equipment, (3) an interface which transfers review results with SEM images showing the defects to an advanced data analysis system, and (4) defect sampling function which allows selection of type of defects for reviewing.ドキュメント
ドキュメントなし