説明
Electron Microscope Measuring Instruments構成
構成なしOEMモデルの説明
The S-9300 is standard equipped with a laser interferometer stage for ultra-high target addressing precision, mini-environment and FOUP compatible loadports. Advanced automation scenarios like FOUP delivery by automatic material handling systems (AMHS) and single wafer identification can be supported.ドキュメント
ドキュメントなし
HITACHI
S-9300
検証済み
カテゴリ
CD-SEM
最終検証: 30日以上前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
115158
ウェーハサイズ:
8"/200mm
ヴィンテージ:
2008
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
HITACHI
S-9300
カテゴリ
CD-SEM
最終検証: 30日以上前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
115158
ウェーハサイズ:
8"/200mm
ヴィンテージ:
2008
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Electron Microscope Measuring Instruments構成
構成なしOEMモデルの説明
The S-9300 is standard equipped with a laser interferometer stage for ultra-high target addressing precision, mini-environment and FOUP compatible loadports. Advanced automation scenarios like FOUP delivery by automatic material handling systems (AMHS) and single wafer identification can be supported.ドキュメント
ドキュメントなし