説明
説明なし構成
-Main Body -Main PC -Load Port -Main Power Supply -PDUOEMモデルの説明
Designed specifically for defect inspection and 2D metrology for LED applications, the ICOS WI-2280 also provides enhanced inspection capabilities and increased flexibility for microelectromechanical systems (MEMS) and semiconductor wafers spanning two inches to eight inches in size.ドキュメント
ドキュメントなし
KLA / ICOS
WI-2280
検証済み
カテゴリ
Defect Inspection
最終検証: 60日以上前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
98587
ウェーハサイズ:
8"/200mm
ヴィンテージ:
2014
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示KLA / ICOS
WI-2280
カテゴリ
Defect Inspection
最終検証: 60日以上前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
98587
ウェーハサイズ:
8"/200mm
ヴィンテージ:
2014
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
-Main Body -Main PC -Load Port -Main Power Supply -PDUOEMモデルの説明
Designed specifically for defect inspection and 2D metrology for LED applications, the ICOS WI-2280 also provides enhanced inspection capabilities and increased flexibility for microelectromechanical systems (MEMS) and semiconductor wafers spanning two inches to eight inches in size.ドキュメント
ドキュメントなし