説明
With ADC Defect inspection & review for semiconductors Handler System - Dual Factory Interface - Open Cassette (QTY 1)構成
Software Version - 5.3.20.4 CIM - SECS, GEM Process - Defect InspectionOEMモデルの説明
The AIT II is a patterned wafer inspection system for 150 to 300 mm wafers that provides fast, accurate feedback on process tool performance. It offers an integrated solution for automated defect classification and analysis, quickly turning defect data into yield-enhancing information. It is designed for flexibility in films, etch, photo, and CMP applications and offers advantages such as reducing process excursions, increasing overall equipment effectiveness, improving yield stability/predictability, and augmenting line monitoring.ドキュメント
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KLA
AIT II
カテゴリ
Defect Inspection
最終検証： 6日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
146710
ウェーハサイズ：
8"/200mm
ヴィンテージ：
2000
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
With ADC Defect inspection & review for semiconductors Handler System - Dual Factory Interface - Open Cassette (QTY 1)構成
Software Version - 5.3.20.4 CIM - SECS, GEM Process - Defect InspectionOEMモデルの説明
The AIT II is a patterned wafer inspection system for 150 to 300 mm wafers that provides fast, accurate feedback on process tool performance. It offers an integrated solution for automated defect classification and analysis, quickly turning defect data into yield-enhancing information. It is designed for flexibility in films, etch, photo, and CMP applications and offers advantages such as reducing process excursions, increasing overall equipment effectiveness, improving yield stability/predictability, and augmenting line monitoring.ドキュメント
ドキュメントなし